Microscopic Insights into the Sputtering of Ag{111} Induced by C60 and Ga Bombardment

J. Phys. Chem. B, 108 (23), 7831 -7838, 2004. 10.1021/jp049936a S1089-5647(04)09936-5
Web Release Date: May 13, 2004

Microscopic Insights into the Sputtering of Ag{111} Induced by C₆₀ and Ga Bombardment

Zbigniew Postawa,* Bartlomiej Czerwinski, Marek Szewczyk, Edward J. Smiley, Nicholas Winograd, and Barbara J. Garrison*

Smoluchowski Institute of Physics, Jagiellonian University, Krakow, Poland, Department of Chemistry, 152 Davey Laboratory, Penn State University, University Park, Pennsylvania 16802, and 184 Materials Research Institute, Penn State University, University Park, Pennsylvania 16802

Received: January 6, 2004

In Final Form: March 22, 2004

Abstract:

Molecular dynamics computer simulations have been utilized to compare the differences in the mechanism of sputtering of Ag{111} by kiloelectronvolt Ga and C₆₀ projectiles. The calculated kinetic energy distributions of Ag monomers and Ag₂ dimers compare favorably with experimental results. The damage caused by the C₆₀ particle left in the sample is less than the depth of material that the next impinging C₆₀ particle would remove, thus supporting the preliminary experimental observations that molecular depth profiling is possible with C₆₀ projectile beams.

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