J. Phys. Chem. C, 112 (7), 2724 -2728, 2008. 10.1021/jp0776513 S1932-7447(07)07651-0
Web Release Date: January 25, 2008

Copyright © 2008 American Chemical Society

Electrochemical Gating in Scanning Electrochemical Microscopy

Päivi Ahonen, Virginia Ruiz, Kyösti Kontturi, Peter Liljeroth,* and Bernadette M. Quinn*

Laboratory of Physical Chemistry and Electrochemistry, Helsinki University of Technology, P.O. Box 6100, FIN-02015 HUT, Finland, Department of Chemistry, University of Burgos, Pza. Misael Bañuelos, s/n, Burgos 09001, Spain, and Condensed Matter and Interfaces, Debye Institute, University of Utrecht, P.O. Box 80000, 3508 TA Utrecht, the Netherlands

Received: September 23, 2007

In Final Form: November 19, 2007

Abstract:

We demonstrate that scanning electrochemical microscopy (SECM) can be used to determine the conductivity of nanoparticle assemblies as a function of assembly potential. In contrast to conventional electron transport measurements, this method is unique in that electrical connection to the film is not required. The electrochemical potential of the assembly is set through the Nernst equation by the redox mediator present in solution in analogy to the gate electrode in traditional three-terminal transport experiments. In this proof-of-concept report, we show that the conductance of an assembly of small gold nanocrystals (NCs), so-called monolayer-protected clusters (MPCs), is strongly dependent on the electrochemical potential. This is due to the sub-attofarad capacitance of the MPC cores that gives rise to single-electron charging effects at room temperature.


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