Received November 20, 2003

Revised December 15, 2003

Abstract:

To stabilize nanotube-modified atomic force microscopy tips and extend their functionality, a method for conformal polymer coating of the tips and removal of the polymer from just the probing nanotube end is described. Expressions quantifying stabilization of the tips against buckling and bending due to stresses encountered while imaging are developed. Electrical conductivity of the probes is demonstrated by their use in scanned conductance microscopy, where a substantial sensitivity advantage over standard tips is realized and explained. Further advantages of these electrically insulated (save for the tip) probes are discussed, including their proposed application in bioelectrochemical research.

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