Nano Lett., 6 (4), 583 -586, 2006. 10.1021/nl052134m S1530-6984(05)02134-X
Web Release Date: March 15, 2006

Copyright © 2006 American Chemical Society

Zeptogram-Scale Nanomechanical Mass Sensing

Y. T. Yang, C. Callegari, X. L. Feng, K. L. Ekinci, and M. L. Roukes*

Kavli Nanoscience Institute, California Institute of Technology, Mail Code 114-36, Pasadena, California 91125

Received October 29, 2005

Revised February 5, 2006

Abstract:

Very high frequency (VHF) nanoelectromechanical systems (NEMS) provide unprecedented sensitivity for inertial mass sensing. We demonstrate in situ measurements in real time with mass noise floor ~20 zg. Our best mass resolution corresponds to ~7 zg, equivalent to ~30 xenon atoms or the mass of an individual 4 kDa molecule. Detailed analysis of the ultimate sensitivity of such devices based on these experimental results indicates that NEMS can ultimately provide inertial mass sensing of individual intact, electrically neutral macromolecules with single-Dalton (1 amu) resolution.


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