Nano Lett., 7 (4), 998 -1002, 2007. 10.1021/nl070083i S1530-6984(07)00083-5
Web Release Date: March 27, 2007

Copyright © 2007 American Chemical Society

Structural Phase Contrast in Polycrystalline Organic Semiconductor Films Observed by Broadband Near-Field Optical Spectroscopy

Robert Pomraenke, Claus Ropers, Julien Renard, Christoph Lienau,* Larry Lüer, Dario Polli, and Giulio Cerullo*

Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, 12489 Berlin, Germany, Institut für Physik, Carl von Ossietzky Universität, 26111 Oldenburg, Germany, and ULTRAS-CNR-INFM, Dipartimento di Fisica, Politecnico di Milano, Piazza Leonardo da Vinci 32, I-20133 Milano, Italy

Received January 12, 2007

Revised March 5, 2007

Abstract:

We demonstrate a novel near-field absorption spectrometer with 100 nm spatial resolution based on an ultrabroadband Ti:sapphire oscillator coupled to an aperture NSOM, enabling the measurement of nanoscale absorption spectra. The instrument is particularly suited for structural phase-selective imaging of organic materials at the nanoscale. We demonstrate that variations in the local absorption spectrum allow us to distinguish between the crystalline and the amorphous phases in polycrystalline phtalocyanine films, thus providing previously unavailable information on their mesoscopic texture.


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