Web Release Date: November 2,
Simple Approach for High-Contrast Optical Imaging and Characterization of Graphene-Based Sheets
and
Department of Mechanical Engineering, Northwestern University, Evanston, Illinois 60208, Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, and Department of Chemistry and Biology, Ryerson University, 350 Victoria Street, Toronto, Ontario M5B 2K3, Canada
Received June 13, 2007
Revised September 3, 2007
Abstract:
A simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast between the graphene-based materials and the substrate is obtained by choosing appropriate optical properties and thickness of the dielectric layer. The effective refractive index and optical absorption coefficient of graphene oxide, thermally reduced graphene oxide, and graphene are obtained by comparing the predicted and measured contrasts.
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