Fast-scan cyclic voltammetry as a method to measure rapid heterogeneous electron-transfer kinetics

David O. Wipf, Eric W. Kristensen, Mark R. Deakin, R. Mark Wightman
Anal. Chem., 1988, 60 (4), pp 306–310
DOI: 10.1021/ac00155a006
Publication Date: February 1988
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  • Published In Issue February, 1988

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