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Secondary Fluorescence Enhancement in Confocal X-ray Microscopy Analysis

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Dimosthenis Sokaras* and Andreas-Germanos Karydas

Institute of Nuclear Physics, N.C.S.R. “Demokritos”, Athens, Greece

Anal. Chem., 2009, 81 (12), pp 4946–4954

DOI: 10.1021/ac900688n

Publication Date (Web): May 22, 2009

* To whom correspondence should be addressed. E-mail: dsokaras@inp.demokritos.gr.

Section:

Inorganic Analytical Chemistry

Abstract

In the present work, the influence of the secondary fluorescence enhancement in confocal X-ray microscopy analysis is studied when stratified type of materials are examined. Through a proper mathematical formalism, an exact global theoretical model is presented which accounts for the secondary fluorescence enhancement when either particle (3D-Micro particle induced X-ray emission) or photon (3D-Micro X-ray fluorescence) microbeams are used in the excitation channel. The contribution of the secondary fluorescence effect to the confocal X-ray intensity profiles was calculated for some typical representative cases. In addition, the influence of several experimental parameters was examined in terms of their influence in the absolute intensity and shape of the secondary fluorescence intensity profile.

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This article has been cited by 1 ACS Journal articles (1 most recent appear below).

X-ray Spectrometry
Kouichi Tsuji and Kazuhiko Nakano, Yoshio Takahashi, Kouichi Hayashi, Chul-Un Ro
Analytical Chemistry2010 82 (12), 4950-4987
- X-ray Spectrometry
  Kouichi Tsuji and Kazuhiko Nakano, Yoshio Takahashi, Kouichi Hayashi, Chul-Un Ro
  Analytical Chemistry2010 82 (12), 4950-4987
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History

Published In Issue June 15, 2009
Article ASAPMay 22, 2009
Received: April 1, 2009
Accepted: May 5, 2009

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Secondary Fluorescence Enhancement in Confocal X-ray Microscopy Analysis

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