Ohmic Drop Compensation in Voltammetry:  Iterative Correction of the Applied Potential

A new method of ohmic potential drop correction for use with potential step and sweep voltammetric methods is described. The method, iterative correction of the applied potential (ICAP), essentially replaces an electronic positive feedback correction with a digital positive feedback correction. This paper will present one form of the ICAP procedure, in which voltammetric current data acquired by a high-speed digital oscilloscope are used to iteratively generate a compensating potential waveform that is then synthesized by an arbitrary waveform generator. The ICAP method is advantageous for high-speed measurements, since many of the difficulties caused by electronic positive feedback compensation are eliminated.