Scanning electrochemical microscopy - a new technique for the characterization and modification of surfaces

Allen J. Bard, Guy Denuault, Chongmok Lee, Daniel Mandler, David O. Wipf
Acc. Chem. Res., 1990, 23 (11), pp 357–363
DOI: 10.1021/ar00179a002
Publication Date: November 1990
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  • Published In Issue November, 1990

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