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Article

GISAXS View of Vanadium/Cerium Oxide Thin Films and Influence of Lithium Intercalation

Supporting Info

M. Lu

ić Lav

ević,*^† P. Dub

ek,^‡ Z. Crnjak Orel,^§ and A. Turković^‡

Department of Physics, Faculty of Chemical Technology, University of Split, Teslina 10, 21000 Split, Croatia, Institute Ru

er Bokovi, P. O. Box 10002, Zagreb, Croatia, and National Institute of Chemistry, Hajdrihova 19, SI-1001 Ljubljana, Slovenia

J. Chem. Inf. Model., 2005, 45 (6), pp 1553–1557

DOI: 10.1021/ci050152j

Publication Date (Web): October 25, 2005

Corresponding author. Tel.:+385-21-385-633. Fax: +385-21-384-964. E-mail: malula@ktf-split.hr.

†

University of Split.

‡

Institute Ruer Bošković.

National Institute of Chemistry.

Abstract

An examination of structural modifications, induced by mixing vanadium and cerium oxides and by the introduction of lithium in vanadium and mixed vanadium/cerium oxide films, was performed using synchrotron sourced grazing incidence small-angle X-ray scattering. Samples were sol−gel-derived films, deposited by a dip-coating technique. An analysis of the scattering data, acquired by a two-dimensional detection system, is based on the comparison of the surface and bulk characteristics of the film. The trend of estimated structural modifications is supported by the results of previous investigations on a different length scale, performed by atomic force microscopy.

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