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High Resolution Energy Dispersive Spectrometry with Charge-Induced X-Rays: Principles, Comparison with Other Methods, and Possible Applications

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A. E. Pillay and M. Peisach

Department of Chemistry, University of the Witwatersrand, PO WITS, 2050 South Africa

J. Chem. Educ., 1996, 73 (6), p 508

DOI: 10.1021/ed073p508

Publication Date (Web): June 1, 1996

Section:

History, Education, and Documentation

Abstract

A novel phenomenon using Charge-Induced X-rays (CHIX) for selective analytical applications recently has come to the fore. The method is a spin-off from the PIXE technique. It utilizes light or heavy charged particles from low energy accelerators for the production of intense X-ray fluxes by the discharge of accumulated potential on insulating targets. Such X-ray fluxes from suitable ionic compounds with comparitively high melting points, such as the metal fluorides, could be harnessed for practical applications of high specificity. The principles of this method, its relative capabilities, and possible practical applications are discussed.