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A Refrigerator Magnet Analog of Scanning-Probe Microscopy
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Abstract
Images of individual atoms can be obtained via scanning-probe microscopes. These experimental techniques are leading to breakthroughs in the developement of new materials and are enhancing our understanding of atomic-scale phenomena. They all involve a probe tip terminated in on or just a few atoms. The interaction between the tip and a sample surface is measured as the tip moves (scans) relative to the surface. A property such as electric current or interatomic force is used to measure the strength of the tip-sureface interaction. Examples include Sanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). The activity described on the Student Side of this insert uses the magnetic interactions between a flexible-sheet refrigerator magnet and a probe tip cut from the same magnet as a macroscopic analog of scanning probe microscopies.
Keywords (Audience):
High School / Introductory ChemistryKeywords (Domain):
Laboratory InstructionKeywords (Feature):
JCE Classroom ActivityKeywords (Pedagogy):
Hands-On Learning / ManipulativesKeywords (Subject):
Surface ScienceCiting Articles
Citation data is made available by participants in CrossRef's Cited-by Linking service. For a more comprehensive list of citations to this article, users are encouraged to perform a search in SciFinder.
This article has been cited by 6 ACS Journal articles (5 most recent appear below).
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Exploring the Scanning Probe: A Simple Hands-on Experiment Simulating the Operation and Characteristics of the Atomic Force Microscope
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Anthony Layson, Ryan Leib and Dale Teeters2010 1010 (), 167-176A simple yet effective model atomic force microscope is presented for the purpose of introducing students to the field of scanning probe microscopy. The model is used to demonstrate the basic characteristics of the atomic force microscope by realistically ...
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Atomic Scale Imaging: A Hands-On Scanning Probe Microscopy Laboratory for Undergraduates
Chuan-Jian Zhong , Li Han , Mathew M. Maye , Jin Luo , Nancy N. Kariuki and Wayne E. Jones Jr.Journal of Chemical Education2003 80 (2), 194Atomic Scale Imaging: A Hands-On Scanning Probe Microscopy Laboratory for Undergraduates
Chuan-Jian Zhong , Li Han , Mathew M. Maye , Jin Luo , Nancy N. Kariuki and Wayne E. Jones Jr.Journal of Chemical Education2003 80 (2), 194A new hands-on laboratory experiment using a scanning probe microscope is described for an advanced undergraduate course. The laboratory involves a combination of scanning tunneling microscopy (STM) and atomic force microscopy (AFM) with an emphasis on ...
Chemical Analysis Using Scanning Force Microscopy. An Undergraduate Laboratory Experiment
Mathew M. Maye , Jin Luo , Li Han and Chuan-Jian ZhongJournal of Chemical Education2002 79 (2), 207Chemical Analysis Using Scanning Force Microscopy. An Undergraduate Laboratory Experiment
Mathew M. Maye , Jin Luo , Li Han and Chuan-Jian ZhongJournal of Chemical Education2002 79 (2), 207This undergraduate laboratory experiment uses scanning force microscopy to perform chemical analysis at chemically designed surfaces. It involves lateral force measurements at self-assembled monolayers to provide chemical mapping capability. Monolayer ...
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- Received: August 03, 2009
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