An Elementary Picture of Dielectric Spectroscopy in Solids: Physical Basis

Adolfo Delgado
Institute of Biomedical Engineering, Polytechnical School of Montreal, Montreal, PQ, Canada H3C 3A7
Mario F. García-Sánchez , Jean-Claude M'Peko , A. Rabdel Ruiz-Salvador , Geonel Rodríguez-Gattorno and Yuri Echevarría
Institute of Materials and Reagents (IMRE), University of Havana, Havana, Cuba 10400
Froilan Fernández-Gutierrez
Higher Pedagogical Institute, "E. J. Varona", Faculty of Sciences, Havana, Cuba 11400
J. Chem. Educ., 2003, 80 (9), p 1062
DOI: 10.1021/ed080p1062
Publication Date (Web): September 1, 2003

Abstract

Dielectric spectroscopy (DS) techniques play a major role in gaining insight into important peculiarities of dielectric responses of materials. The principles of DS of solids are discussed starting from simple concepts. The physical basis is presented, emphasizing the meaning of the magnitudes and phenomena involved, including the microscopic aspects of the chemical nature of solids. The applications, advantages, and limitations of DS are also discussed. Some examples are given that provide a practical overview of the main ideas as well as to show the usefulness of the technique.

Keywords (Audience):

Second-Year Undergraduate

Keywords (Domain):

Chemical Education Research

Keywords (Feature):

Research: Science and Education

Keywords (Pedagogy):

Student-Centered Learning

Keywords (Subject):

Conductivity
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History

  • Received: August 03, 2009

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