Atomic Scale Imaging: A Hands-On Scanning Probe Microscopy Laboratory for Undergraduates

Chuan-Jian Zhong , Li Han , Mathew M. Maye , Jin Luo , Nancy N. Kariuki and Wayne E. Jones Jr.
Department of Chemistry and Institute of Materials Research, State University of New York, Binghamton, NY 13902
J. Chem. Educ., 2003, 80 (2), p 194
DOI: 10.1021/ed080p194
Publication Date (Web): February 1, 2003
History, Education, and Documentation

Abstract

A new hands-on laboratory experiment using a scanning probe microscope is described for an advanced undergraduate course. The laboratory involves a combination of scanning tunneling microscopy (STM) and atomic force microscopy (AFM) with an emphasis on atomic scale visualization and imaging of both conductive and nonconductive materials. Well-defined crystalline materials, highly-ordered pyrolytic graphite and muscovite mica, are studied using STM and AFM, respectively. Students experience sample preparation, tip preparation, microscope setup, and data acquisition. The images are analyzed and interpreted by determination of atomic spacing, pattern and density, comparison with known crystalline structures, and discussions of tunneling current and tip-sample interactions. Direct student benefits include atomic visualization of concepts and analytical imaging techniques.

Keywords (Audience):

Second-Year Undergraduate

Keywords (Domain):

Laboratory Instruction

Keywords (Pedagogy):

Hands-On Learning / Manipulatives

Keywords (Subject):

Materials Science
View: Hi-Res PDF | PDF w/ Links

Tools

SciFinder Links

SciFinder subscribers: Click to sign in | Not a SciFinder subscriber? Learn more at www.cas.org

Explore by:

History

  • Received: August 03, 2009

Recommend & Share

  • Share on ACS NetworkACS Network
  • Add to FacebookFacebook
  • Tweet ThisTweet This
  • Add to CiteULikeCiteULike
  • Add to NewsvineNewsvine
  • Digg ThisDigg This
  • Add to DeliciousDelicious

Related Content