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Getting Physical with Your Chemistry: Mechanically Investigating Local Structure and Properties of Surfaces with the Atomic Force Microscope

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William F. Heinz

Department of Physiology, John Hopkins School of Medicine, Baltimore, MD 21205

Jan H. Hoh

Department of Chemical Engineering, John Hopkins University, Baltimore, MD 21218; Department of Physiology, John Hopkins School of Medicine, Baltimore, MD 21205

J. Chem. Educ., 2005, 82 (5), p 695

DOI: 10.1021/ed082p695

Publication Date (Web): May 1, 2005

Section:

Radiation Chemistry, Photochemistry, and Photographic and Other Reprographic Processes

Abstract

The atomic force microscope is an extremely powerful and versatile tool for probing the chemistry, material properties, and dynamics of surfaces and interfaces at the nanometer and picoNewton scale in a sampleâ€™s native environment. A description of the main components of current instruments, including cantilevers and their design, is presented, along with the modes of operation, origin of contrast, and factors which contribute to the spatial resolution. Key concepts and best practices related to data acquisition, image interpretation, and force measurement are discussed.

Keywords (Audience):

Second-Year Undergraduate

Keywords (Feature):

Symposium Report

Keywords (Subject):

Noncovalent Interactions

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This article has been cited by 3 ACS Journal articles (3 most recent appear below).

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