Measuring the Charge State of Point Defects on MgO/Ag(001)

T. Knig, G. H. Simon, H.-P. Rust, G. Pacchioni, M. Heyde* and H.-J. Freund
Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D-14195 Berlin, Germany, and Dipartimento di Scienza dei Materiali, Universit di Milano-Bicocca, via R. Cozzi, 53-20125 Milano, Italy
J. Am. Chem. Soc., 2009, 131 (48), pp 17544–17545
DOI: 10.1021/ja908049n
Publication Date (Web): November 12, 2009
Copyright © 2009 American Chemical Society
heyde@fhi-berlin.mpg.de, †

Fritz-Haber-Institut der Max-Planck-Gesellschaft.

, ‡

Universit di Milano-Bicocca.

Abstract

Abstract Image

A detailed understanding of surface defects is highly desirable, e.g. to clarify their role as active sites in catalysis. Here localized defects on the surface of MgO films deposited on Ag(001) are investigated. Since the electronic structure of color centers depends on their local position, spectroscopic signals are highly convoluted and often difficult to disentangle. In this study we aimed to obtain morphological and spectroscopic information on single color centers at a microscopic level with frequency modulated dynamic force microscopy (FM-DFM) and scanning tunneling microscopy (STM) in an ultrahigh vacuum and at low temperature. Four of the major and in literature mostly discussed defect types on MgO have been characterized by their charge state and finally identified by the complementary application of FM-DFM and STM in combination with density functional theory results.

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History

  • Published In Issue December 09, 2009
  • Article ASAPNovember 12, 2009
  • Received: September 30, 2009

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