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Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. Part 2. XRD and EXAFS Characterization

F. Montilla,^† E. Morallón,*^† A. De Battisti,^‡ A. Benedetti,^§ H. Yamashita,^# and J. L. Vázquez^†

Departamento de Qumica Fsica, Universidad de Alicante, Apartado de Correos 99, Alicante, Spain E-03080, Dipartimento di Chimica, Universit degli Studi di Ferrara, Via Borsari 46, 44100 Ferrara, Italy, Dipartimento Chimica Fsica, Universit C Foscari, Calle Larga S. Marta 2137, 30123 Venezia and via Torino 155/b, 30170 Mestre-Venezia, Italy, and Department of Materials Science and Processing, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan

J. Phys. Chem. B, 2004, 108 (16), pp 5044–5050

DOI: 10.1021/jp0374814

Publication Date (Web): March 18, 2004

†

Universidad de Alicante.

To whom correspondence should be addressed. E-mail: morallon@ ua.es.

‡

Università degli Studi di Ferrara.

Università Cà Foscari.

Osaka University.

Abstract

Several antimony and platinum doped tin dioxide electrodes supported on titanium have been characterized by X-ray diffraction (XRD) and X-ray absorption spectroscopy (EXAFS) techniques. Ti/SnO₂−Sb electrodes show a rutile-type nanostructure with a distorted unit-cell because of the substitution of the Sn(IV) ion by Sb(V). The presence of platinum on the electrode coating modifies the lattice parameters of the SnO₂ cell due to an amorphization of tin oxide layers. The structural modifications on the different electrode after anodic polarization−deactivation have been analyzed.

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