Dye-Sensitized SnO2 Electrodes with Iodide and Pseudohalide Redox Mediators

Bryan V. Bergeron, Andras Marton, Gerko Oskam, and Gerald J. Meyer*
Department of Chemistry and Department of Materials Science and Engineering, The Johns Hopkins University, Baltimore, Maryland 21218, and Departamento de Fsica Aplicada, CINVESTAV-IPN, Mrida, Yuc. 97310, Mexico
J. Phys. Chem. B, 2005, 109 (2), pp 937–943
DOI: 10.1021/jp0461347
Publication Date (Web): December 21, 2004
Copyright © 2005 American Chemical Society

 The Johns Hopkins University.

,

 CINVESTAV-IPN.

,
*

 To whom correspondence should be addressed.

Abstract

Dye-sensitized mesoporous nanocrystalline SnO2 electrodes and the pseudohalogen redox mediator (SeCN)2/SeCN- or (SCN)2/SCN- or the halogen redox mediator I3-/I- were implemented for regenerative solar cell studies. Adsorption isotherms of the sensitizers Ru(deeb)(bpy)2(PF6)2, Ru(deeb)2(dpp)(PF6)2, and Ru(deeb)2(bpz)(PF6)2, where deeb is 4,4‘-diethylester-2,2‘-bipyridine, dpp is 2,3-dipyridyl pyrazine, and bpz is bipyrazine, binding to the SnO2 surface were well described by the Langmuir model from which the saturation coverage, Γ0 = 1.7 × 10-8 mol/cm2, and surface-adduct formation constant, Kad = 2 × 105 M-1, were obtained. Following excited-state interfacial electron transfer, the oxidized sensitizers were reduced by donors present in the acetonitrile electrolyte as shown by transient absorption spectroscopy. With iodide as the donor, a rate constant k > 108 s-1 was measured for sensitizer regeneration. In regenerative solar cells, it was found that the incident photon-to-current conversion efficiencies and open circuit voltages (Voc) were comparable for (SeCN)2/SeCN- and I3-/I- for all three sensitizers. The Voc varied linearly with the logarithm of the short circuit photocurrent densities (Jsc), with typical correlations of 50−60 mV/decade. Capacitance measurements of the SnO2 electrode in the presence of I3-/I-, (SeCN)2/SeCN-, or (SCN)2/SCN- are reported.

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History

  • Published In Issue January 20, 2005
  • Received August 26, 2004
    Revised October 21, 2004

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