Microscopic Insight into the Sputtering of Thin Polystyrene Films on Ag{111} Induced by Large and Slow Ar Clusters

Lukasz Rzeznik, Bartlomiej Czerwinski, Barbara J. Garrison, Nicholas Winograd, and Zbigniew Postawa*
Smoluchowski Institute of Physics, Jagiellonian University, ul. Reymonta 4, 30-059 Krakow, Poland, and Department of Chemistry, The Pennsylvania State University, 104 Chemistry Building, University Park, Pennsylvania 16802
J. Phys. Chem. C, 2008, 112 (2), pp 521–531
DOI: 10.1021/jp076667q
Publication Date (Web): December 15, 2007
Copyright © 2008 American Chemical Society

 Jagiellonian University.

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 The Pennsylvania State University.

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*

 Corresponding author. E-mail:  zp@castor.if.uj.edu.pl; tel.:  (4812) 663-5626.

Abstract

Molecular dynamics computer simulations were employed to model the bombardment of Ag{111} covered with a monolayer of sec-butyl-terminated polystyrene tetramer (PS4) molecules by the impact of large and slow clusters. The investigated surface was bombarded with clusters composed of between hundreds to 29 000 Ar atoms having a very low kinetic energy per atom (0.1−40 eV). The sputtering yield of molecular species and their internal, angular, and kinetic energy distributions were analyzed. The simulations demonstrated quite clearly that the physics of ejection by these large and slow clusters is distinct from the ejection events stimulated by the popular SIMS clusters, C60, Au3, and SF5.

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History

  • Published In Issue January 17, 2008
  • Received August 19, 2007
    Revised October 16, 2007

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