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Nano Bubbles on a Hydrophobic Surface in Water Observed by Tapping-Mode Atomic Force Microscopy
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Section:Abstract
The silicon wafer hydrophobized with OTS was immersed into water to observe the surface in-situ by tapping-mode AFM. A large number of nano-size domain images were found on the surface. Their shapes were characterized by the height image procedure of AFM, and the differences of the properties compared to those of the bare surface were analyzed using the phase image procedure and the interaction force curves. All the results consistently implied that the domains represent the nanoscopic bubbles attached on the surface. This was confirmed by the fact that no domain was observed in the case of the surfaces hydrophobized in the AFM fluid cell without exposure to air. The apparent contact angle of the bubbles was much smaller than that expected macroscopically, which was postulated to be the reason bubbles were able to sit stably on the surface.
Citing Articles
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This article has been cited by 59 ACS Journal articles (5 most recent appear below).
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History
- Published In Issue August 08, 2000
- Received February 14, 2000
Revised May 24, 2000
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