Role of the Critical Micelle Concentration in the Electrochemical Deposition of Nanostructured ZnO Films under Utilization of Amphiphilic Molecules

Cathrin Boeckler, Torsten Oekermann,* Armin Feldhoff, and Michael Wark
Leibniz Universitt Hannover, Institute of Physical Chemistry and Electrochemistry, Callinstrasse 3-3A, 30167 Hannover, Germany
Langmuir, 2006, 22 (22), pp 9427–9430
DOI: 10.1021/la0615544
Publication Date (Web): September 20, 2006
Copyright © 2006 American Chemical Society
*

 Corresponding author. Email:  torsten.oekermann@pci.uni-hannover.de

Abstract

Abstract Image

A detailed understanding of micelle formation that occurs above a critical micelle concentration (cmc) is a crucial point for the surfactant-assisted preparation of porous materials such as molecular sieves. However, the role of the cmc in the surfactant-assisted electrodeposition of porous oxides is widely unknown. In this study, we investigated the electrodeposition of ZnO films under utilization of alkyl sulfates and alkyl sulfonates with different chain lengths. Cmc values of the surfactants were measured directly in the electrodeposition bath by surface tension measurements. Subsequently, we performed electrodeposition with surfactant concentrations from above the cmc down to concentrations well below the cmc. Beside a lamellar ZnO phase already known from earlier studies, a second nanoparticular ZnO phase was found at concentrations below the cmc.

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History

  • Published In Issue October 24, 2006
  • Received May 31, 2006
    Revised August 17, 2006

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