Contact Studies of Weakly Compressed PEG Brushes with a Quartz Crystal Resonator

David A. Brass and Kenneth R. Shull*
Department of Materials Science & Engineering, Northwestern University, 2220 Campus Drive, Evanston, Illinois 60208-3108
Langmuir, 2006, 22 (22), pp 9225–9233
DOI: 10.1021/la061793r
Publication Date (Web): September 20, 2006
Copyright © 2006 American Chemical Society
*

In papers with more than one author, the asterisk indicates the name of the author to whom inquiries about the paper should be addressed.

Abstract

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A quartz crystal resonator was used to characterize the contact of an elastomeric polymer membrane with a grafted poly(ethylene glycol) (PEG) brush in an aqueous environment. A two-layer model of the acoustic impedance of the system was used to measure the brush thickness before and after contact with the membrane. This model was further extended to include multiple layers, allowing characterization of other monomeric density profiles along the brush thickness. The polymer brush maintains a hydrated layer between the membrane and the quartz crystal surface, the thickness of which could be determined to within 1 nm. We show that the technique is very well suited for studying the properties of highly hydrated layers with thicknesses between 0 and 100 nm at low contact pressures corresponding to a very weak compression of the PEG brush.

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History

  • Published In Issue October 24, 2006
  • Received June 21, 2006
    Revised August 3, 2006

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