CHEMTECH
December 1998
CHEMTECH 1998, 28(12), 10-13.
Copyright © 1998 by the American Chemical Society.
References(1) Zhou, C.; Pivarnik, P.; Auger, S.; Rand, A.; Letcher, S. Sens. Actuators, B 1997, 42, 169-175. (2) Brown, C.; Li, Y.; Seelenbinder, J.; Pivarnik, P.; Rand, A.; Letcher, S.; Platek, M.; Gregory, O. Anal. Chem. 1998, 70(14), 2991-2996. (3) Ye, J.; Letcher, S.; Rand, A. J. Food Sci. 1997, 62(5), 1067-1072. (4) Zhou, C.; Pivarnik, P.; Rand, A.; Letcher, S. Biosens. Bioelectron. 1998, 13, 495-500. (5) Setlik, B.; Heskett, D.; Briere, M. A. Electromigration Investigations of Aluminum Alloy Interconnects; Proceedings of the IEEE University-Government-Industry Microelectronics Symposium, July 1997, Rochester, NY. |
