Epitaxial Electrodeposition of Optically Transparent Hole-Conducting CuI on n-Si(111)Click to copy article linkArticle link copied!
- Avishek BanikAvishek BanikDepartment of Chemistry and Graduate Center for Materials Research, Missouri University of Science and Technology, Rolla, Missouri 65409-1170, United StatesMore by Avishek Banik
- John Z. TubbesingJohn Z. TubbesingDepartment of Chemistry and Graduate Center for Materials Research, Missouri University of Science and Technology, Rolla, Missouri 65409-1170, United StatesMore by John Z. Tubbesing
- Bin LuoBin LuoDepartment of Chemistry and Graduate Center for Materials Research, Missouri University of Science and Technology, Rolla, Missouri 65409-1170, United StatesMore by Bin Luo
- Xiaoting ZhangXiaoting ZhangDepartment of Chemistry and Graduate Center for Materials Research, Missouri University of Science and Technology, Rolla, Missouri 65409-1170, United StatesMore by Xiaoting Zhang
- Jay A. Switzer*Jay A. Switzer*Email: [email protected]Department of Chemistry and Graduate Center for Materials Research, Missouri University of Science and Technology, Rolla, Missouri 65409-1170, United StatesMore by Jay A. Switzer
Abstract

The expansion of future optoelectronic materials into transparent flexible electronics, perovskite, organic, and tandem photovoltaics depends on the development of high-performance p-type materials with optical transparency. We introduce the epitaxial growth of γ-CuI, a wide band gap p-type semiconductor with the zinc blende structure, on single crystalline Si(111) using a simple, cost-effective, room-temperature electrochemical method. The deposited epitaxial film grows with a high degree of in-plane and out-of-plane order, templated by the Si(111) substrate. A deposition mechanism is proposed, in which epitaxial CuI seed crystals are nucleated on the freshly etched n-Si(111) surface, followed by the simultaneous oxidation of Si to form a thin layer of SiOx and the lateral overgrowth of the CuI seeds into a continuous film. The rectifying p-CuI/SiOx/n-Si heterojunction diode shows an ideality factor of 1.5, a built-in voltage of 0.67 V, and a barrier height of 0.91 eV. The epitaxial CuI film has been epitaxially lifted off by chemical etching to produce textured CuI foils with an out-of-plane and in-plane order that mimics that of single crystals.
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This article is cited by 7 publications.
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, 092512. https://doi.org/10.1149/1945-7111/ac8eeb
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