Pattern Matching and Active Simulation Method for Process Fault Diagnosis
- Weijun Li
- Sai Gu
- Xiangping Zhang
- , and
- Tao Chen*
Fault detection and diagnosis is a crucial approach to ensure safe and efficient operation of chemical processes. This paper reports a new fault diagnosis method that exploits dynamic process simulation and pattern matching techniques. The proposed method consists of a simulated fault database which, through pattern matching, helps narrow down the fault candidates in an efficient way. An optimization based fault reconstruction method is then developed to determine the fault pattern from the candidates and the corresponding magnitude and time of occurrence of the fault. A major advantage of this approach is that it is capable of diagnosing both single and multiple faults. We illustrate the effectiveness of the proposed method through case studies of the Tennessee Eastman benchmark process.
This article is cited by 3 publications.
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