Pattern Matching and Active Simulation Method for Process Fault Diagnosis
- Weijun LiWeijun LiDepartment of Chemical and Process Engineering, University of Surrey, Guildford GU2 7XH, United KingdomMore by Weijun Li
- ,
- Sai GuSai GuDepartment of Chemical and Process Engineering, University of Surrey, Guildford GU2 7XH, United KingdomMore by Sai Gu
- ,
- Xiangping ZhangXiangping ZhangInstitute of Process Engineering, Chinese Academy of Sciences, Beijing 100190, ChinaMore by Xiangping Zhang
- , and
- Tao Chen*Tao Chen*Email: [email protected]Department of Chemical and Process Engineering, University of Surrey, Guildford GU2 7XH, United KingdomMore by Tao Chen
Abstract

Fault detection and diagnosis is a crucial approach to ensure safe and efficient operation of chemical processes. This paper reports a new fault diagnosis method that exploits dynamic process simulation and pattern matching techniques. The proposed method consists of a simulated fault database which, through pattern matching, helps narrow down the fault candidates in an efficient way. An optimization based fault reconstruction method is then developed to determine the fault pattern from the candidates and the corresponding magnitude and time of occurrence of the fault. A major advantage of this approach is that it is capable of diagnosing both single and multiple faults. We illustrate the effectiveness of the proposed method through case studies of the Tennessee Eastman benchmark process.
Cited By
This article is cited by 3 publications.
- Xiaomiao Song, Qinglong Liu, Mingxin Dong, Yifei Meng, Chuanrui Qin, Dongfeng Zhao, Fabo Yin, Jiangbo Jiu. Chemical Process Alarm Root Cause Diagnosis Method Based on the Combination of Data-Knowledge-Driven Method and Time Retrospective Reasoning. ACS Omega 2022, 7
(24)
, 20886-20905. https://doi.org/10.1021/acsomega.2c01529
- Hiromasa Kaneko. Estimation and visualization of process states using latent variable models based on Gaussian process. Analytical Science Advances 2021, 2
(5-6)
, 326-333. https://doi.org/10.1002/ansa.202000122
- Maria G. Juarez, Vicente J. Botti, Adriana S. Giret. Digital Twins: Review and Challenges. Journal of Computing and Information Science in Engineering 2021, 21
(3)
https://doi.org/10.1115/1.4050244