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Elucidating Piezoelectricity and Strain in Monolayer MoS2 at the Nanoscale Using Kelvin Probe Force Microscopy
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    Elucidating Piezoelectricity and Strain in Monolayer MoS2 at the Nanoscale Using Kelvin Probe Force Microscopy
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    • Alex C. De Palma
      Alex C. De Palma
      Materials Science and Engineering Program, Texas Materials Institute, University of Texas at Austin, Austin, Texas 78712, United States
    • Xinyue Peng
      Xinyue Peng
      Department of Physics and Center for Complex Quantum Systems, University of Texas at Austin, Austin, Texas 78712, United States
      More by Xinyue Peng
    • Saba Arash
      Saba Arash
      Department of Physics and Center for Complex Quantum Systems, University of Texas at Austin, Austin, Texas 78712, United States
      More by Saba Arash
    • Frank Y. Gao
      Frank Y. Gao
      Department of Physics and Center for Complex Quantum Systems, University of Texas at Austin, Austin, Texas 78712, United States
      More by Frank Y. Gao
    • Edoardo Baldini
      Edoardo Baldini
      Department of Physics and Center for Complex Quantum Systems, University of Texas at Austin, Austin, Texas 78712, United States
    • Xiaoqin Li
      Xiaoqin Li
      Department of Physics and Center for Complex Quantum Systems, University of Texas at Austin, Austin, Texas 78712, United States
      More by Xiaoqin Li
    • Edward T. Yu*
      Edward T. Yu
      Materials Science and Engineering Program, Texas Materials Institute, University of Texas at Austin, Austin, Texas 78712, United States
      Microelectronics Research Center, Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, Texas 78758, United States
      *Email: [email protected]
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    Nano Letters

    Cite this: Nano Lett. 2024, 24, 6, 1835–1842
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    https://doi.org/10.1021/acs.nanolett.3c03100
    Published February 5, 2024
    Copyright © 2024 American Chemical Society

    Abstract

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    Strain engineering modifies the optical and electronic properties of atomically thin transition metal dichalcogenides. Highly inhomogeneous strain distributions in two-dimensional materials can be easily realized, enabling control of properties on the nanoscale; however, methods for probing strain on the nanoscale remain challenging. In this work, we characterize inhomogeneously strained monolayer MoS2 via Kelvin probe force microscopy and electrostatic gating, isolating the contributions of strain from other electrostatic effects and enabling the measurement of all components of the two-dimensional strain tensor on length scales less than 100 nm. The combination of these methods is used to calculate the spatial distribution of the electrostatic potential resulting from piezoelectricity, presenting a powerful way to characterize inhomogeneous strain and piezoelectricity that can be extended toward a variety of 2D materials.

    Copyright © 2024 American Chemical Society

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    Supporting Information

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    The Supporting Information is available free of charge at https://pubs.acs.org/doi/10.1021/acs.nanolett.3c03100.

    • Sample fabrication, experimental KPFM methods, details of theoretical Vt vs Vg dependence, details of strain, and piezoelectricity calculations (PDF)

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    Cited By

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    This article is cited by 2 publications.

    1. Sheng Han, Jiong Liu, Ana I. Pérez-Jiménez, Zhou Lei, Pei Yan, Yu Zhang, Xiangyu Guo, Rongxu Bai, Shen Hu, Xuefeng Wu, David W. Zhang, Qingqing Sun, Deji Akinwande, Edward T. Yu, Li Ji. Visualizing and Controlling of Photogenerated Electron–Hole Pair Separation in Monolayer WS2 Nanobubbles under Piezoelectric Field. ACS Applied Materials & Interfaces 2024, 16 (28) , 36735-36744. https://doi.org/10.1021/acsami.4c00092
    2. Claire M. Ganski, Alex C. De Palma, Edward T. Yu. Enhanced Electromechanical Response Due to Inhomogeneous Strain in Monolayer MoS2. Nano Letters 2024, 24 (26) , 7903-7910. https://doi.org/10.1021/acs.nanolett.4c01126

    Nano Letters

    Cite this: Nano Lett. 2024, 24, 6, 1835–1842
    Click to copy citationCitation copied!
    https://doi.org/10.1021/acs.nanolett.3c03100
    Published February 5, 2024
    Copyright © 2024 American Chemical Society

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