Influence of Interlayer Stacking on Gate-Induced Carrier Accumulation in Bilayer MoS2
- Mina Maruyama*Mina Maruyama*Email: [email protected]. Phone: +81 (0)29 853 5921. Fax: +81 (0)29 853 5924Department of Physics, Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba 305-8571, JapanMore by Mina Maruyama,
- Kosuke NagashioKosuke NagashioDepartment of Materials Engineering, Graduate School of Engineering, The University of Tokyo, 7-3-1 Hongo, Tokyo 113-8656, JapanMore by Kosuke Nagashio, and
- Susumu OkadaSusumu OkadaDepartment of Physics, Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba 305-8571, JapanMore by Susumu Okada
Abstract

Atomic layer materials with semiconducting electronic properties have attracted much attention as conducting channels in field-effect transistors (FETs). Here, we investigate the electronic structures of bilayer MoS2 in a dual-gate FET model using first-principles total-energy calculations based on density functional theory (DFT). Our calculations show that selective electron doping occurs in bilayer MoS2 under a perpendicular electric field owing to a band offset between the positive and negative-electrode sides of the MoS2 layers. Furthermore, we observe a further partial carrier distribution in bilayer MoS2 by decreasing the interlayer interaction owing to a twisted stacking arrangement. It is expected that the positive-electrode-side layer works as a conducting channel, and on the other hand, the negative-electrode-side layer works as a screening layer in bilayer MoS2-FETs.
Cited By
This article is cited by 1 publications.
- Mina Maruyama, Kosuke Nagashio, Susumu Okada. Carrier Distribution Control in van der Waals Heterostructures of Mo S 2 and WS 2 by Field-Induced Band-Edge Engineering. Physical Review Applied 2020, 14 (4) https://doi.org/10.1103/PhysRevApplied.14.044028




