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Influence of Interlayer Stacking on Gate-Induced Carrier Accumulation in Bilayer MoS2

  • Mina Maruyama*
    Mina Maruyama
    Department of Physics, Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba 305-8571, Japan
    *Email: [email protected]. Phone: +81 (0)29 853 5921. Fax: +81 (0)29 853 5924
  • Kosuke Nagashio
    Kosuke Nagashio
    Department of Materials Engineering, Graduate School of Engineering, The University of Tokyo, 7-3-1 Hongo, Tokyo 113-8656, Japan
  • , and 
  • Susumu Okada
    Susumu Okada
    Department of Physics, Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba 305-8571, Japan
    More by Susumu Okada
Cite this: ACS Appl. Electron. Mater. 2020, 2, 5, 1352–1357
Publication Date (Web):April 21, 2020
https://doi.org/10.1021/acsaelm.0c00139
Copyright © 2020 American Chemical Society
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Abstract

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Atomic layer materials with semiconducting electronic properties have attracted much attention as conducting channels in field-effect transistors (FETs). Here, we investigate the electronic structures of bilayer MoS2 in a dual-gate FET model using first-principles total-energy calculations based on density functional theory (DFT). Our calculations show that selective electron doping occurs in bilayer MoS2 under a perpendicular electric field owing to a band offset between the positive and negative-electrode sides of the MoS2 layers. Furthermore, we observe a further partial carrier distribution in bilayer MoS2 by decreasing the interlayer interaction owing to a twisted stacking arrangement. It is expected that the positive-electrode-side layer works as a conducting channel, and on the other hand, the negative-electrode-side layer works as a screening layer in bilayer MoS2-FETs.

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The Supporting Information is available free of charge at https://pubs.acs.org/doi/10.1021/acsaelm.0c00139.

  • Electronic and geometric structures of twisted bilayer MoS2 with twisted angles; calculation model using DFT combined with the ESM method (PDF)

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Cited By


This article is cited by 1 publications.

  1. Mina Maruyama, Kosuke Nagashio, Susumu Okada. Carrier Distribution Control in van der Waals Heterostructures of Mo S 2 and WS 2 by Field-Induced Band-Edge Engineering. Physical Review Applied 2020, 14 (4) https://doi.org/10.1103/PhysRevApplied.14.044028

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