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Moisture-Induced Structural Degradation in Methylammonium Lead Iodide Perovskite Thin Films

  • Panteha Toloueinia
    Panteha Toloueinia
    Institute of Materials Science, University of Connecticut, Storrs, Connecticut 06269, United States
  • Hamidreza Khassaf
    Hamidreza Khassaf
    Institute of Materials Science, University of Connecticut, Storrs, Connecticut 06269, United States
    Department of Materials Science and Engineering, University of Connecticut, Storrs, Connecticut 06269, United States
  • Alireza Shirazi Amin
    Alireza Shirazi Amin
    Institute of Materials Science, University of Connecticut, Storrs, Connecticut 06269, United States
  • Zachary M. Tobin
    Zachary M. Tobin
    Department of Chemistry, University of Connecticut, Storrs, Connecticut 06269, United States
  • S. Pamir Alpay
    S. Pamir Alpay
    Institute of Materials Science, University of Connecticut, Storrs, Connecticut 06269, United States
    Department of Materials Science and Engineering, University of Connecticut, Storrs, Connecticut 06269, United States
  • , and 
  • Steven L. Suib*
    Steven L. Suib
    Institute of Materials Science, University of Connecticut, Storrs, Connecticut 06269, United States
    Department of Materials Science and Engineering, University of Connecticut, Storrs, Connecticut 06269, United States
    Department of Chemistry, University of Connecticut, Storrs, Connecticut 06269, United States
    *Email: [email protected]. Institute of Materials Science, University of Connecticut, U-3136, 97 N. Eagleville Road, Storrs, Connecticut 06269, United States.
Cite this: ACS Appl. Energy Mater. 2020, 3, 9, 8240–8248
Publication Date (Web):August 19, 2020
https://doi.org/10.1021/acsaem.0c00638
Copyright © 2020 American Chemical Society

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    Abstract

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    Methylammonium lead iodide (CH3NH3PbI3, MAPbI3) belongs to the group of organic–inorganic halide perovskites (OIHPs) that exhibit exceptional electrical and optical behavior suitable for photovoltaic applications. However, improving its structural and chemical stability and robustness remains a challenge for OIHPs to be considered a feasible active material in optoelectronic devices. This is due to the fact that this material is very susceptible to degrade under various intrinsic and extrinsic factors. Therefore, it is crucial to understand the mechanisms through which MAPbI3 undergoes chemical degradation under operating conditions such as a relatively humid environment. We present the structural characteristics of MAPbI3 under working conditions that suggest the routes of phase segregation as a result of exposing to highly moist media. We use dark pulse discharge behavior and current–voltage (IV) variations of MAPbI3 under different moisture levels to investigate the nature of structural degradation in OIHPs. We show that while relatively lower levels of humidity (∼60% RH) have a limited impact on the structural stability of MAPbI3, exposure to higher levels of moisture (∼100% RH) results in the formation of PbI2 and aqueous CH3NH3I, which fundamentally change the charge transport characteristics in MAPbI3. Our findings explain the ongoing debate on the presence of a threshold for the humidity that triggers irreversible structural transformation and leads to full degradation of MAPbI3.

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    • The structural analysis of the fully degraded film using scanning electron microscopy/elemental analysis (SEM/EDS) followed by current–voltage and pulse discharge measurements for different humidity levels and exposure times; also, the actual images of different moisture-induced films are enclosed (PDF)

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