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Surface Phenomena During Plasma-Assisted Atomic Layer Etching of SiO2
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    Surface Phenomena During Plasma-Assisted Atomic Layer Etching of SiO2
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    Department of Chemical and Biological Engineering, Colorado School of Mines, 1613 Illinois Street, Golden, Colorado 80401, United States
    Applied Physics Department, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands
    § Lam Research Corporation, 4650 Cushing Parkway, Fremont, California 94538, United States
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    ACS Applied Materials & Interfaces

    Cite this: ACS Appl. Mater. Interfaces 2017, 9, 36, 31067–31075
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    https://doi.org/10.1021/acsami.7b08234
    Published August 10, 2017
    Copyright © 2017 American Chemical Society

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    Surface phenomena during atomic layer etching (ALE) of SiO2 were studied during sequential half-cycles of plasma-assisted fluorocarbon (CFx) film deposition and Ar plasma activation of the CFx film using in situ surface infrared spectroscopy and ellipsometry. Infrared spectra of the surface after the CFx deposition half-cycle from a C4F8/Ar plasma show that an atomically thin mixing layer is formed between the deposited CFx layer and the underlying SiO2 film. Etching during the Ar plasma cycle is activated by Ar+ bombardment of the CFx layer, which results in the simultaneous removal of surface CFx and the underlying SiO2 film. The interfacial mixing layer in ALE is atomically thin due to the low ion energy during CFx deposition, which combined with an ultrathin CFx layer ensures an etch rate of a few monolayers per cycle. In situ ellipsometry shows that for a ∼4 Å thick CFx film, ∼3–4 Å of SiO2 was etched per cycle. However, during the Ar plasma half-cycle, etching proceeds beyond complete removal of the surface CFx layer as F-containing radicals are slowly released into the plasma from the reactor walls. Buildup of CFx on reactor walls leads to a gradual increase in the etch per cycle.

    Copyright © 2017 American Chemical Society

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    This article is cited by 44 publications.

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    ACS Applied Materials & Interfaces

    Cite this: ACS Appl. Mater. Interfaces 2017, 9, 36, 31067–31075
    Click to copy citationCitation copied!
    https://doi.org/10.1021/acsami.7b08234
    Published August 10, 2017
    Copyright © 2017 American Chemical Society

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