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Topological Phase Buried in a Chalcogenide Superlattice Monitored by Helicity-Dependent Kerr Measurement

  • Richarj Mondal*
    Richarj Mondal
    Division of Applied Physics, Faculty of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba 305-8573, Japan
    *E-mail: [email protected] (R.M.).
  • Yuki Aihara
    Yuki Aihara
    Division of Applied Physics, Faculty of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba 305-8573, Japan
    More by Yuki Aihara
  • Yuta Saito
    Yuta Saito
    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 5, 1-1-1 Higashi, Tsukuba 305-8565, Japan
    More by Yuta Saito
  • Paul Fons
    Paul Fons
    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 5, 1-1-1 Higashi, Tsukuba 305-8565, Japan
    More by Paul Fons
  • Alexander V. Kolobov
    Alexander V. Kolobov
    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 5, 1-1-1 Higashi, Tsukuba 305-8565, Japan
  • Junji Tominaga
    Junji Tominaga
    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 5, 1-1-1 Higashi, Tsukuba 305-8565, Japan
  • , and 
  • Muneaki Hase*
    Muneaki Hase
    Division of Applied Physics, Faculty of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba 305-8573, Japan
    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 5, 1-1-1 Higashi, Tsukuba 305-8565, Japan
    *E-mail: [email protected] (M.H.).
    More by Muneaki Hase
Cite this: ACS Appl. Mater. Interfaces 2018, 10, 31, 26781–26786
Publication Date (Web):July 18, 2018
https://doi.org/10.1021/acsami.8b07974
Copyright © 2018 American Chemical Society
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Abstract

Abstract Image

Chalcogenide superlattices (SLs), formed by the alternate stacking of GeTe and Sb2Te3 layers, also referred to as interfacial phase-change memory (iPCM), are a leading candidate for spin-based memory device applications. Theoretically, the iPCM structure has been predicted to form a three-dimensional topological insulator or Dirac semimetal phase depending on the constituent layer thicknesses. Here, we experimentally investigate the topological insulating nature of chalcogenide SLs using a helicity-dependent time-resolved Kerr measurement. The helicity-dependent Kerr signal is observed to exhibit a four-cycle oscillation with π/2 periodicity, suggesting the existence of a Dirac-like cone in some chalcogenide SLs. Furthermore, we found that increasing the thickness of the GeTe layer dramatically changed the periodicity, indicating a phase transition from a Dirac semimetal into a trivial insulator. Our results demonstrate that thickness-tuned chalcogenide SLs can play an important role in the manipulation of topological states, which may open up new possibilities for spintronic devices based on chalcogenide SLs.

Cited By


This article is cited by 2 publications.

  1. Takara Suzuki, Richarj Mondal, Yuta Saito, Paul Fons, Alexander V Kolobov, Junji Tominaga, Hidemi Shigekawa, Muneaki Hase. Photon energy dependence of Kerr rotation in GeTe/Sb 2 Te 3 chalcogenide superlattices. Journal of Physics: Condensed Matter 2019, 31 (41) , 415502. https://doi.org/10.1088/1361-648X/ab2e9f
  2. Yu Kyoung Ryu, Riccardo Frisenda, Andres Castellanos-Gomez. Superlattices based on van der Waals 2D materials. Chemical Communications 2019, 55 (77) , 11498-11510. https://doi.org/10.1039/C9CC04919C

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