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Porous Silica Nanotube Thin Films as Thermally Insulating Barrier Coatings

Cite this: ACS Appl. Nano Mater. 2020, 3, 4, 3168–3173
Publication Date (Web):March 19, 2020
https://doi.org/10.1021/acsanm.0c00596
Copyright © 2020 American Chemical Society

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    Abstract

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    The fabrication and examination of a porous silica thin film, potentially for use as an insulating thin film, were investigated. A vertically aligned carbon nanotube (CNT) forest, created by chemical vapor deposition (CVD), was used as scaffolding to construct the porous film. Silicon was deposited on the CNT forest using low-pressure CVD (LPCVD) and then oxidized to remove the CNTs and convert the silicon to silica for electrical or thermal passivation (e.g., thermal barrier). Thermal conductivity was determined using a 1D heat-transfer analysis that equated radiative heat loss in a vacuum with conduction through the substrate and thin film stack. A comparison of the surface temperature differences between a sample film and a reference of comparable thermal resistance enabled determination of the increase in the thermal resistance and of the thermal conductivity of the films. For film thicknesses of approximately 55 μm, the cross-plane thermal conductivity was found to be 0.054–0.071 W m–1 K–1 over 378–422 K. This thermal conductivity value is in the range of other silica aerogels and consistent with the low gravimetric density of 0.15 g cm–3 for the samples. The film is also relatively smooth and flat, with an average arithmetic mean roughness of 1.04 μm.

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    The Supporting Information is available free of charge at https://pubs.acs.org/doi/10.1021/acsanm.0c00596.

    • Images of the CNT template, details on the surface roughness/morphology, results from transmission electron microscopy studies, details of the temperature measurements, and uncertainty analysis (PDF)

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    Cited By

    This article is cited by 4 publications.

    1. Husam M. Walwil, Yunshan Zhao, Yee Kan Koh. Accurate Thermal Conductivity Measurements of Porous Thin Films by Time-Domain Thermoreflectance. ACS Applied Materials & Interfaces 2024, 16 (2) , 2861-2867. https://doi.org/10.1021/acsami.3c13418
    2. Joohyun Lee, Wonhyuk Jo, Ji-Hwan Kwon, Bruce Griffin, Byeong-Gwan Cho, Eric C. Landahl, Sooheyong Lee. Time-Resolved Structural Measurement of Thermal Resistance across a Buried Semiconductor Heterostructure Interface. Materials 2023, 16 (23) , 7450. https://doi.org/10.3390/ma16237450
    3. Y Chorbadzhiyska, R Georgiev, B Georgieva, T Babeva. Impact of annealing and soft template concentration on optical and sensing properties of wet-deposited SiO 2 thin films. Journal of Physics: Conference Series 2023, 2487 (1) , 012035. https://doi.org/10.1088/1742-6596/2487/1/012035
    4. Huihuang Ma, Haiyan Liu, Jialei Shen, Jingqi Luo, Xiaodong Zhou. Optical and thermal insulation properties of silica aerogel under a 7 kW·cm-2 power laser irradiation. Ceramics International 2022, 48 (12) , 16584-16598. https://doi.org/10.1016/j.ceramint.2022.02.203

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