Probing Transient Localized Electromagnetic Fields Using Low-Energy Point-Projection Electron Microscopy
- Germann HergertGermann HergertCarl von Ossietzky Universität, Institut für Physik and Center of Interface Science, 26129 Oldenburg, GermanyMore by Germann Hergert
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- Andreas WösteAndreas WösteCarl von Ossietzky Universität, Institut für Physik and Center of Interface Science, 26129 Oldenburg, GermanyMore by Andreas Wöste
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- Jan VogelsangJan VogelsangCarl von Ossietzky Universität, Institut für Physik and Center of Interface Science, 26129 Oldenburg, GermanyMore by Jan Vogelsang
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- Thomas QuenzelThomas QuenzelCarl von Ossietzky Universität, Institut für Physik and Center of Interface Science, 26129 Oldenburg, GermanyMore by Thomas Quenzel
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- Dong WangDong WangTU Ilmenau, Institut für Werkstofftechnik und Institut für Mikro- und Nanotechnologien MakroNano, 98693 Ilmenau, GermanyMore by Dong Wang
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- Petra GrossPetra GrossCarl von Ossietzky Universität, Institut für Physik and Center of Interface Science, 26129 Oldenburg, GermanyMore by Petra Gross
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- Christoph Lienau*Christoph Lienau*E-mail: [email protected]Carl von Ossietzky Universität, Institut für Physik and Center of Interface Science, 26129 Oldenburg, GermanyCarl von Ossietzky Universität, Forschungszentrum Neurosensorik, 26129 Oldenburg, GermanyMore by Christoph Lienau
Abstract
Low kinetic energy electrons are of interest for probing nanoscale dynamic processes using ultrafast electron microscopy techniques. Their low velocities reduce radiation doses and enhance the interaction with confined electromagnetic fields and, thus, may enable ultrafast spectroscopy of single nanostructures. Recent improvements in the spatial and temporal resolution of ultrafast, low-energy electron microscopy have been achieved by combining nanotip photoemitters and point-projection imaging schemes. Here, we use such an ultrafast point-projection electron microscope (UPEM) to analyze the interaction of low-energy electrons with transient electric fields created by photoemission from a nanogap antenna. By analyzing their kinetic energy distribution, we separate angular deflection due to radial field components from electron energy gain and loss due to their axial acceleration. Our measurements open up a route toward the spatial and temporal characterization of vectorial near-fields by low-energy electron streaking spectroscopy.
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