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    A Planar Scanning Probe Microscope
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    • Stefan Ernst
      Stefan Ernst
      Walter Schottky Institut and Physik Department, Technische Universität München, Am Coulombwall 4, 85748 Garching, Germany
      Nanosystems Initiative Munich (NIM), Schellingstraße 4, 80799 München, Germany
      More by Stefan Ernst
    • Dominik M. Irber
      Dominik M. Irber
      Walter Schottky Institut and Physik Department, Technische Universität München, Am Coulombwall 4, 85748 Garching, Germany
      Nanosystems Initiative Munich (NIM), Schellingstraße 4, 80799 München, Germany
      More by Dominik M. Irber
    • Andreas M. Waeber
      Andreas M. Waeber
      Walter Schottky Institut and Physik Department, Technische Universität München, Am Coulombwall 4, 85748 Garching, Germany
      Nanosystems Initiative Munich (NIM), Schellingstraße 4, 80799 München, Germany
      More by Andreas M. Waeber
    • Georg Braunbeck
      Georg Braunbeck
      Walter Schottky Institut and Physik Department, Technische Universität München, Am Coulombwall 4, 85748 Garching, Germany
      Nanosystems Initiative Munich (NIM), Schellingstraße 4, 80799 München, Germany
      More by Georg Braunbeck
    • Friedemann Reinhard*
      Friedemann Reinhard
      Walter Schottky Institut and Physik Department, Technische Universität München, Am Coulombwall 4, 85748 Garching, Germany
      Nanosystems Initiative Munich (NIM), Schellingstraße 4, 80799 München, Germany
      *E-mail: [email protected]
      More by Friedemann Reinhard
      Orcidhttp://orcid.org/0000-0001-6273-7399
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    ACS Photonics

    Cite this: ACS Photonics 2019, 6, 2, 327–331
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    https://doi.org/10.1021/acsphotonics.8b01583
    Published January 24, 2019
    Copyright © 2019 American Chemical Society
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    Abstract

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    Scanning probe microscopy (SPM) is traditionally based on very sharp tips, where the small size of the apex is critical for resolution. This paradigm is about to shift, since a novel generation of planar probes (such as color centers in diamond, superconducting sensors, and single electron transistors) promises to image small electric and magnetic fields with hitherto inaccessible sensitivity. To date, much effort has been put into fabricating these planar sensors on tip-like structures. This compromises performance and poses a considerable engineering challenge, which is mastered by only a few laboratories. Here we present a radically simplified, tipless, approach, a technique for scanning an extended planar sensor parallel to a planar sample at a distance of few tens of nanometers. It is based on a combination of far-field optical techniques to measure both tilt and distance between probe and sample with sub-mrad and sub-nm precision, respectively. Employing these measurements as a feedback signal, we demonstrate near-field optical imaging of plasmonic modes in silver nanowires by a single NV center. Our scheme simultaneously improves the sensor quality and enlarges the range of available sensors beyond the limitations of existing tip-based schemes.

    Copyright © 2019 American Chemical Society

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    Supporting Information

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    The Supporting Information is available free of charge on the ACS Publications website at DOI: 10.1021/acsphotonics.8b01583.

    • Measurement of NV–sample distance; Technical details of the setup; Derivation of fit functions; Extended discussion of near-field effects (PDF).

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    This article is cited by 13 publications.

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    2. Hsuan-Wei Liu, Michael A. Becker, Korenobu Matsuzaki, Randhir Kumar, Stephan Götzinger, Vahid Sandoghdar. Robust Tipless Positioning Device for Near-Field Investigations: Press and Roll Scan (PROscan). ACS Nano 2022, 16 (8) , 12831-12839. https://doi.org/10.1021/acsnano.2c05047
    3. Paul Weinbrenner, Patricia Quellmalz, Christian Giese, Luis Flacke, Manuel Müller, Matthias Althammer, Stephan Geprägs, Rudolf Gross, Friedemann Reinhard. Planar scanning probe microscopy enables vector magnetic field imaging at the nanoscale. Quantum Science and Technology 2025, 10 (1) , 015037. https://doi.org/10.1088/2058-9565/ad93fa
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    9. S. C. Scholten, A. J. Healey, I. O. Robertson, G. J. Abrahams, D. A. Broadway, J.-P. Tetienne. Widefield quantum microscopy with nitrogen-vacancy centers in diamond: Strengths, limitations, and prospects. Journal of Applied Physics 2021, 130 (15) https://doi.org/10.1063/5.0066733
    10. Maosen Guo, Mengqi Wang, Pengfei Wang, Diguang Wu, Xiangyu Ye, Pei Yu, You Huang, Fazhan Shi, Ya Wang, Jiangfeng Du. A flexible nitrogen-vacancy center probe for scanning magnetometry. Review of Scientific Instruments 2021, 92 (5) https://doi.org/10.1063/5.0040679
    11. Olav Schiemann. Trendbericht: Elektronen‐Paramagnetische‐Resonanzspektroskopie. Nachrichten aus der Chemie 2021, 69 (4) , 54-62. https://doi.org/10.1002/nadc.20214106853
    12. Dipti Rani, Oliver Opaluch, Elke Neu. Recent Advances in Single Crystal Diamond Device Fabrication for Photonics, Sensing and Nanomechanics. Micromachines 2021, 12 (1) , 36. https://doi.org/10.3390/mi12010036
    13. Kai-Mei C. Fu, Geoffrey Z. Iwata, Arne Wickenbrock, Dmitry Budker. Sensitive magnetometry in challenging environments. AVS Quantum Science 2020, 2 (4) https://doi.org/10.1116/5.0025186
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    ACS Photonics

    Cite this: ACS Photonics 2019, 6, 2, 327–331
    Click to copy citationCitation copied!
    https://doi.org/10.1021/acsphotonics.8b01583
    Published January 24, 2019
    Copyright © 2019 American Chemical Society
    Request reuse permissions

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