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A Planar Scanning Probe Microscope

  • Stefan Ernst
    Stefan Ernst
    Walter Schottky Institut and Physik Department, Technische Universität München, Am Coulombwall 4, 85748 Garching, Germany
    Nanosystems Initiative Munich (NIM), Schellingstraße 4, 80799 München, Germany
    More by Stefan Ernst
  • Dominik M. Irber
    Dominik M. Irber
    Walter Schottky Institut and Physik Department, Technische Universität München, Am Coulombwall 4, 85748 Garching, Germany
    Nanosystems Initiative Munich (NIM), Schellingstraße 4, 80799 München, Germany
  • Andreas M. Waeber
    Andreas M. Waeber
    Walter Schottky Institut and Physik Department, Technische Universität München, Am Coulombwall 4, 85748 Garching, Germany
    Nanosystems Initiative Munich (NIM), Schellingstraße 4, 80799 München, Germany
  • Georg Braunbeck
    Georg Braunbeck
    Walter Schottky Institut and Physik Department, Technische Universität München, Am Coulombwall 4, 85748 Garching, Germany
    Nanosystems Initiative Munich (NIM), Schellingstraße 4, 80799 München, Germany
  • , and 
  • Friedemann Reinhard*
    Friedemann Reinhard
    Walter Schottky Institut and Physik Department, Technische Universität München, Am Coulombwall 4, 85748 Garching, Germany
    Nanosystems Initiative Munich (NIM), Schellingstraße 4, 80799 München, Germany
    *E-mail: [email protected]
Cite this: ACS Photonics 2019, 6, 2, 327–331
Publication Date (Web):January 24, 2019
https://doi.org/10.1021/acsphotonics.8b01583
Copyright © 2019 American Chemical Society

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    Abstract

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    Scanning probe microscopy (SPM) is traditionally based on very sharp tips, where the small size of the apex is critical for resolution. This paradigm is about to shift, since a novel generation of planar probes (such as color centers in diamond, superconducting sensors, and single electron transistors) promises to image small electric and magnetic fields with hitherto inaccessible sensitivity. To date, much effort has been put into fabricating these planar sensors on tip-like structures. This compromises performance and poses a considerable engineering challenge, which is mastered by only a few laboratories. Here we present a radically simplified, tipless, approach, a technique for scanning an extended planar sensor parallel to a planar sample at a distance of few tens of nanometers. It is based on a combination of far-field optical techniques to measure both tilt and distance between probe and sample with sub-mrad and sub-nm precision, respectively. Employing these measurements as a feedback signal, we demonstrate near-field optical imaging of plasmonic modes in silver nanowires by a single NV center. Our scheme simultaneously improves the sensor quality and enlarges the range of available sensors beyond the limitations of existing tip-based schemes.

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    The Supporting Information is available free of charge on the ACS Publications website at DOI: 10.1021/acsphotonics.8b01583.

    • Measurement of NV–sample distance; Technical details of the setup; Derivation of fit functions; Extended discussion of near-field effects (PDF).

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    Cited By

    This article is cited by 9 publications.

    1. Hsuan-Wei Liu, Michael A. Becker, Korenobu Matsuzaki, Randhir Kumar, Stephan Götzinger, Vahid Sandoghdar. Robust Tipless Positioning Device for Near-Field Investigations: Press and Roll Scan (PROscan). ACS Nano 2022, 16 (8) , 12831-12839. https://doi.org/10.1021/acsnano.2c05047
    2. Jiangfeng Du, Fazhan Shi, Xi Kong, Fedor Jelezko, Jörg Wrachtrup. Single-molecule scale magnetic resonance spectroscopy using quantum diamond sensors. Reviews of Modern Physics 2024, 96 (2) https://doi.org/10.1103/RevModPhys.96.025001
    3. Navid Soltani, Elham Rabbany Esfahany, Sergey I. Druzhinin, Gregor Schulte, Julian Müller, Benjamin Butz, Holger Schönherr, Mario Agio, Nemanja Markešević. Biosensing with a scanning planar Yagi-Uda antenna. Biomedical Optics Express 2022, 13 (2) , 539. https://doi.org/10.1364/BOE.445402
    4. G. J. Abrahams, S. C. Scholten, A. J. Healey, I. O. Robertson, N. Dontschuk, S. Q. Lim, B. C. Johnson, D. A. Simpson, L. C. L. Hollenberg, J.-P. Tetienne. An integrated widefield probe for practical diamond nitrogen-vacancy microscopy. Applied Physics Letters 2021, 119 (25) https://doi.org/10.1063/5.0073320
    5. S. C. Scholten, A. J. Healey, I. O. Robertson, G. J. Abrahams, D. A. Broadway, J.-P. Tetienne. Widefield quantum microscopy with nitrogen-vacancy centers in diamond: Strengths, limitations, and prospects. Journal of Applied Physics 2021, 130 (15) https://doi.org/10.1063/5.0066733
    6. Maosen Guo, Mengqi Wang, Pengfei Wang, Diguang Wu, Xiangyu Ye, Pei Yu, You Huang, Fazhan Shi, Ya Wang, Jiangfeng Du. A flexible nitrogen-vacancy center probe for scanning magnetometry. Review of Scientific Instruments 2021, 92 (5) https://doi.org/10.1063/5.0040679
    7. Olav Schiemann. Trendbericht: Elektronen‐Paramagnetische‐Resonanzspektroskopie. Nachrichten aus der Chemie 2021, 69 (4) , 54-62. https://doi.org/10.1002/nadc.20214106853
    8. Dipti Rani, Oliver Opaluch, Elke Neu. Recent Advances in Single Crystal Diamond Device Fabrication for Photonics, Sensing and Nanomechanics. Micromachines 2021, 12 (1) , 36. https://doi.org/10.3390/mi12010036
    9. Kai-Mei C. Fu, Geoffrey Z. Iwata, Arne Wickenbrock, Dmitry Budker. Sensitive magnetometry in challenging environments. AVS Quantum Science 2020, 2 (4) https://doi.org/10.1116/5.0025186

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