ACS Publications. Most Trusted. Most Cited. Most Read
Structural, Optical, and Dielectric Properties of Bi1.5–xZn0.92–yNb1.5O6.92−δ Thin Films Grown by PLD on R-plane Sapphire and LaAlO3 Substrates
My Activity

Figure 1Loading Img
    Research Article

    Structural, Optical, and Dielectric Properties of Bi1.5–xZn0.92–yNb1.5O6.92−δ Thin Films Grown by PLD on R-plane Sapphire and LaAlO3 Substrates
    Click to copy article linkArticle link copied!

    View Author Information
    Institut des Sciences Chimiques de Rennes, UMR-CNRS 6226, Université de Rennes 1, 263 av. Gal Leclerc, 35042 Rennes, France
    National Institute of Materials Physics, Atomistilor 105 bis, 077125 Magurele, Ilfov, Bucharest, Romania
    § Institut d’Electronique et de Télécommunications de Rennes, UMR-CNRS 6164, Université de Rennes 1, IUT de Saint-Brieuc, 18 rue H. Wallon, 22004 Saint-Brieuc, et 263 av. Gal Leclerc, 35042 Rennes, France
    Institut de Physique de Rennes, UMR-CNRS 6251, Université de Rennes 1, 263 av. Gal Leclerc, 35042 Rennes, France
    # Laboratoire en Sciences et Techniques de l’Information, de la Communication et de la Connaissance, ISSTB, UMR-CNRS 6285, Université de Bretagne Occidentale, 6 av. V. Le Gorgeu, 29238 Brest, France
    *E-mail addresses: [email protected] (S.D.), [email protected] (A.C.G.).
    Other Access Options

    ACS Applied Materials & Interfaces

    Cite this: ACS Appl. Mater. Interfaces 2012, 4, 10, 5227–5233
    Click to copy citationCitation copied!
    https://doi.org/10.1021/am301152r
    Published September 20, 2012
    Copyright © 2012 American Chemical Society

    Abstract

    Click to copy section linkSection link copied!
    Abstract Image

    Bi1.5–xZn0.92–yNb1.5O6.92−δ thin films have the potential to be implemented in microwave devices. This work aims to establish the effect of the substrate and of the grain size on the optical and dielectric properties. Bi1.5–xZn0.92–yNb1.5O6.92−δ thin films were grown at 700 °C via pulsed-laser deposition on R-plane sapphire and (100)pc LaAlO3 substrates at various oxygen pressures (30, 50, and 70 Pa). The structure, morphology, dielectric and optical properties were investigated. Despite bismuth and zinc deficiencies, with respect to the Bi1.5Zn0.92Nb1.5O6.92 stoichiometry, the films show the expected cubic pyrochlore structure with a (100) epitaxial-like growth. Different morphologies and related optical and dielectric properties were achieved, depending on the substrate and the oxygen pressure. In contrast to thin films grown on (100)pc LaAlO3, the films deposited on R-plane sapphire are characterized by a graded refractive index along the layer thickness. The refractive index (n) at 630 nm and the relative permittivity (εr) measured at 10 GHz increase with the grain size: on sapphire, n varies from 2.29 to 2.39 and εr varies from 85 to 135, when the grain size increases from 37 nm to 77 nm. On the basis of this trend, visible ellipsometry can be used to probe the characteristics in the microwave range quickly, nondestructively, and at a low cost.

    Copyright © 2012 American Chemical Society

    Read this article

    To access this article, please review the available access options below.

    Get instant access

    Purchase Access

    Read this article for 48 hours. Check out below using your ACS ID or as a guest.

    Recommended

    Access through Your Institution

    You may have access to this article through your institution.

    Your institution does not have access to this content. Add or change your institution or let them know you’d like them to include access.

    Cited By

    Click to copy section linkSection link copied!

    This article is cited by 8 publications.

    1. Shang Sun, Mingdi Lan, Shiying Liu, Guojian Li, Kai Wang, Qiang Wang. Optimizing thermoelectric transport through composite deposition of C-axis oriented interpolated multilayer bismuth films. Surfaces and Interfaces 2024, 54 , 105251. https://doi.org/10.1016/j.surfin.2024.105251
    2. Faezeh A. F. Lahiji, Samiran Bairagi, Roger Magnusson, Mauricio A. Sortica, Daniel Primetzhofer, Erik Ekström, Biplab Paul, Arnaud le Febvrier, Per Eklund. Growth and optical properties of NiO thin films deposited by pulsed dc reactive magnetron sputtering. Journal of Vacuum Science & Technology A 2023, 41 (6) https://doi.org/10.1116/6.0002914
    3. Sharafat Ali, Roger Magnusson, Oleksandr Pshyk, Jens Birch, Per Eklund, Arnaud le Febvrier. Effect of O/N content on the phase, morphology, and optical properties of titanium oxynitride thin films. Journal of Materials Science 2023, 58 (27) , 10975-10985. https://doi.org/10.1007/s10853-023-08717-8
    4. Jibi John, S. R. Chalana, Radhakrishna Prabhu, V. P. Mahadevan Pillai. Effect of oxygen pressure on the structural and optical properties of BaSnO3 films prepared by pulsed laser deposition method. Applied Physics A 2019, 125 (3) https://doi.org/10.1007/s00339-019-2432-0
    5. Xiao-Wei Jin, Yue-Hua Chen, Lu Lu, Shao-Bo Mi, Lei Jin, Hong-Mei Jing, Hong Wang, Chun-Lin Jia. Heteroepitaxial growth and interface structure of pyrochlore (Ca,Ti) 2 (Nb,Ti) 2 O 7 thin films on (1 1 0) NdGaO 3 substrates. Journal of Crystal Growth 2018, 484 , 64-69. https://doi.org/10.1016/j.jcrysgro.2017.12.038
    6. A. Le Febvrier, S. Députier, V. Demange, V. Bouquet, A. C. Galca, A. Iuga, L. Pintilie, M. Guilloux-Viry. Effect of in-plane ordering on dielectric properties of highly {111}-oriented bismuth–zinc–niobate thin films. Journal of Materials Science 2017, 52 (19) , 11306-11313. https://doi.org/10.1007/s10853-017-1297-x
    7. C. Besleaga, A. C. Galca, C. F. Miclea, I. Mercioniu, M. Enculescu, G. E. Stan, A. O. Mateescu, V. Dumitru, S. Costea. Physical properties of Al x In1− x N thin film alloys sputtered at low temperature. Journal of Applied Physics 2014, 116 (15) https://doi.org/10.1063/1.4898565
    8. Svava Daviðsdóttir, Rajashekhara Shabadi, Aurelian Catalin Galca, Inge Hald Andersen, Kai Dirscherl, Rajan Ambat. Investigation of DC magnetron-sputtered TiO2 coatings: Effect of coating thickness, structure, and morphology on photocatalytic activity. Applied Surface Science 2014, 313 , 677-686. https://doi.org/10.1016/j.apsusc.2014.06.047

    ACS Applied Materials & Interfaces

    Cite this: ACS Appl. Mater. Interfaces 2012, 4, 10, 5227–5233
    Click to copy citationCitation copied!
    https://doi.org/10.1021/am301152r
    Published September 20, 2012
    Copyright © 2012 American Chemical Society

    Article Views

    613

    Altmetric

    -

    Citations

    Learn about these metrics

    Article Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.

    Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.

    The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated.