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Polarization-Control of the Potential Barrier at the Electrode Interfaces in Epitaxial Ferroelectric Thin Films
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    Polarization-Control of the Potential Barrier at the Electrode Interfaces in Epitaxial Ferroelectric Thin Films
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    National Institute of Materials Physics, Atomistilor 105 bis, Magurele 077125, Romania
    *E-mail: [email protected]. Phone +40.21.369.0170. Fax: +40.21.369.0177
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    ACS Applied Materials & Interfaces

    Cite this: ACS Appl. Mater. Interfaces 2014, 6, 4, 2929–2939
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    https://doi.org/10.1021/am405508k
    Published January 21, 2014
    Copyright © 2014 American Chemical Society

    Abstract

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    Electrode interface is a key element in controlling the macroscopic electrical properties of the ferroelectric capacitors based on thin films. In the case of epitaxial ferroelectrics, the electrode interface is essential in controlling the leakage current and the polarization switching, two important elements in the read/write processes of nonvolatile memories. However, the relation between the polarization bound charges and the electronic properties of the electrode interfaces is not yet well understood. Here we show that polarization charges are controlling the height of the potential barriers at the electrode interfaces in the case of Pb(Zr,Ti)O3 and BaTiO3 epitaxial films. The results suggest that the height is set to a value allowing rapid compensation of the depolarization field during the polarization switching, being almost independent of the metals used for electrodes. This general behavior open a new perspective in engineering interface properties and designing new devices based on epitaxial ferroelectrics.

    Copyright © 2014 American Chemical Society

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    Details regarding the structural characterization of the films, the procedures and methods used to extract relevant quantities from the electrical measurements (e.g., polarization value in the case of a hysteresis loop affected by the leakage current, the density of the free carriers, the height of the potential barrier at the electrode–ferroelectric interface), the XPS investigation (examples of spectra analysis, C contamination, example of spectra used to extract the position of the valence band maximum with respect of the Fermi level), and the TEM investigation (including oxygen content). This material is available free of charge via the Internet at http://pubs.acs.org/.

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    ACS Applied Materials & Interfaces

    Cite this: ACS Appl. Mater. Interfaces 2014, 6, 4, 2929–2939
    Click to copy citationCitation copied!
    https://doi.org/10.1021/am405508k
    Published January 21, 2014
    Copyright © 2014 American Chemical Society

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