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Surface Structure and Electronic Properties of In2O3(111) Single-Crystal Thin Films Grown on Y-Stabilized ZrO2(111)

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    Surface Structure and Electronic Properties of In2O3(111) Single-Crystal Thin Films Grown on Y-Stabilized ZrO2(111)
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    † Department of Chemistry, Chemistry Research Laboratory, University of Oxford, Mansfield Road, Oxford OX1 3TA, United Kingdom
    ‡ Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom
    § Department of Physics, National University of Singapore, Singapore 117542
    # Department of Physics, University of Warwick, Coventry CV4 7AL, United Kingdom
    ⊥ Laboratorio TASC, INFM−CNR, Area Science Park, S.S. 14, Km 163.5, 34012 Trieste, Italy
    || Sincrotrone Trieste, S.C.p.A., S.S. 14, Km 163, Area Science Park, I-34012 Trieste, Italy
    *Corresponding author.
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    Chemistry of Materials

    Cite this: Chem. Mater. 2009, 21, 19, 4353–4355
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    https://doi.org/10.1021/cm901127r
    Published September 1, 2009
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    Copyright © 2009 American Chemical Society

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    X-ray photoemission spectra of highly degenerate ITO thin films and Poisson-MTFA calculation diagrams of surface electron accumation layer (PDF). This material is available free of charge via the Internet at http://pubs.acs.org/.

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    Cite this: Chem. Mater. 2009, 21, 19, 4353–4355
    Click to copy citationCitation copied!
    https://doi.org/10.1021/cm901127r
    Published September 1, 2009
    Copyright © 2009 American Chemical Society
    Request reuse permissions

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