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Physical Processes in Nanomaterials and Nanostructures

Multiexciton Solar Cells of CuInSe2 Nanocrystals
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McKetta Department of Chemical Engineering, Texas Materials Institute, Center for Nano- and Molecular Science and Technology, The University of Texas at Austin, Austin, Texas 78712, United States
NovaCentrix, 200-B Parker Drive, Suite 580, Austin, Texas 78728, United States
§ Center for Nanoscale Materials, Argonne National Laboratories, Argonne, Illinios 60439, United States
Department of Chemistry, Northwestern University, Evanston, Illinois 60208, United States
*E-mail: [email protected]. Tel.: +1-512-471-5633. Fax: +1-512-471-7060.
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The Journal of Physical Chemistry Letters

Cite this: J. Phys. Chem. Lett. 2014, 5, 2, 304–309
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https://doi.org/10.1021/jz402596v
Published December 26, 2013

Copyright © 2013 American Chemical Society. This publication is licensed under these Terms of Use.

Abstract

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Peak external quantum efficiencies (EQEs) of just over 120% were observed in photovoltaic (PV) devices of CuInSe2 nanocrystals prepared with a photonic curing process. The extraction of more than one electron/hole pair as a result of the absorption of a single photon can occur if multiple excitons are generated and extracted. Multiexciton generation (MEG) in the nanocrystal films was substantiated by transient absorption spectroscopy. We propose that photonic curing leads to sufficient electronic coupling between nanocrystals to enable multiexciton extraction under typical solar illumination conditions. Under low light conditions, however, the EQE drops significantly, indicating that photonic curing-induced ligand desorption creates a significant amount of traps in the film that limit the overall power conversion efficiency of the device.

Copyright © 2013 American Chemical Society

A maximum of 34% of the energy available in sunlight can be converted to electricity by a single junction solar cell, known as the Shockley–Queisser limit. (1) The semiconductor in the device does not absorb photons with energy less than its band gap energy, and photon energy greater than the band gap is lost as heat due to the rapid relaxation of the photoexcited electron and hole to their band minima before they can be extracted as electrical current. One way to surpass the Shockley–Queisser limit is to use quantum dots that convert high-energy photons into multiple electron–hole pairs that can be extracted as photocurrent by the device. (2, 3) Colloidal nanocrystals provide a convenient source of quantum dots in which multiexciton generation (MEG) has been observed optically from a host of materials, including PbS, PbSe, PbTe, CdSe, InAs, and Si. (4-8) Extraction of more than one electron per absorbed photon as electrical current in devices has also been reported, (9-12) with a few instances of device quantum efficiencies (QEs) exceeding 100%, PbS (internal QE only), (13) PbSe (external QE, EQE) (14) nanocrystal solar cells, and an organic device exhibiting a related process of singlet fission. (15) Here, we report photovoltaic (PV) devices of CuInSe2 nanocrystals with peak EQEs of over 120% that result from multiexciton generation and extraction.

CuInSe2 is an important model semiconductor for PV devices that is closely related to Cu(InxGa1–x)Se2 (CIGS), which holds the record for highest device efficiency of all thin film semiconductors at just over 20%. (16) PV devices made from ink-deposited CuInSe2 nanocrystals have reached power conversion efficiencies of 3%, limited by poor charge transport. (17-19) Ink-deposited Cu(InxGa1–x)S2 nanocrystals can be sintered into polycrystalline films by heating (>500 °C) under selenium vapor (i.e., selenization) to achieve much higher efficiencies of just over 12%. (20, 21) To try to avoid the need for high temperature selenization, an alternative nanocrystal film processing technique called photonic curing is explored here to improve charge transport in the nanocrystal film. Photonic curing was carried out using a PulseForge 3300 (NovaCentrix) tool that uses pulsed light from a xenon flash lamp with spectrally broad blackbody radiation that can rapidly heat to very high temperature. Photonic curing can provide enough energy to sinter nanocrystals, (22) but in this study, relatively mild pulse conditions were used to remove organic ligands and bring nanocrystals into better electrical contact without destroying their nanoscale dimensions. Nanocrystal films processed in this way were found to yield PVs with peak EQEs exceeding 100%, indicating the possible occurrence of MEG and extraction from the devices. Transient absorption (TA) spectroscopy was employed to verify that MEG does indeed occur in the nanocrystal films.

PV devices were made by spray-depositing CuInSe2 nanocrystals from toluene dispersions on Au-coated soda lime glass substrates similar to Akhavan et al. (17) and then curing the nanocrystal films with the PulseForge tool (Figure 1) in a closed chamber with a quartz window using a single 160 μs light pulse with flux ranging from 2 to 3 J/cm2. The CdS buffer layer and ZnO/ITO top contacts were then added. Nanocrystal films pulsed with 2.2 J/cm2 light reach about 600 °C within 1 ms, which removes the oleylamine ligand but does not induce crystal grain growth (see Supporting Information Figures S1–S5). Figure 2 shows scanning electron microscope (SEM) images of CuInSe2 nanocrystal films before and after curing with 2.2 and >3 J/cm2 exposure. The nanocrystal grains remain small after 2.2 J/cm2 exposure but clearly grow into larger grains after >3 J/cm2 exposure. (See also the X-ray diffraction (XRD) peak width data in Figure S4 in the Supporting Information)

Figure 1

Figure 1. Photonic curing of nanocrystal films on Au-coated glass substrates. (a) Photonic curing can be used to remove oleylamine capping ligands from the CuInSe2 nanocrystal film without inducing nanocrystal grain growth. (b) When the capping ligands are present, they inhibit the collection of multiexcitons from the film, leading to electron–hole recombination by Auger recombination. (c) Without the ligand barrier between nanocrystals, multiexciton transport becomes much more probable.

Figure 2

Figure 2. CuInSe2 nanocrystal layers before and after photonic curing and their PV device performance. Top-down and cross-sectional SEM images of an oleylamine-capped CuInSe2 (CIS) nanocrystal film on Au-coated glass (a, d) before and after photonic curing with (b, e) 2.2 and (c, f) and 3 J/cm2 pulse fluence. (g–i) Corresponding current–voltage measurements (the black curve is dark current; the red curve is measured under AM1.5G illumination (100 mW/cm2)) of devices made with the nanocrystal films provided below the SEM images.

Although the nanocrystals could be grown into large grains by photonic curing, devices made from these sintered nanocrystals performed very poorly, as shown in Figure 2. Exposure of 3 J/cm2 sintered the nanocrystals but also led to dewetting by the formation of melt balls, leaving significant back contact exposed and devices with almost no short-circuit current. In contrast, devices made with nanocrystals cured using 2.2 J/cm2 exposure gave reasonable device response with a power conversion efficiency (PCE) of 1.25%, similar to the devices made with as-deposited nanocrystals (PCE = 1.19%). The biggest change in device response after photonic curing is a large increase in the short-ci,rcuit current (Jsc) and a drop in the open-circuit voltage (Voc); for example, in Figure 2g the Jsc and Voc changed from 5.65 to 18.65 mA/cm2 and 0.41 to 0.21 V, respectively.

EQE (also known as IPCE) measurements showed that most of the increased short-circuit current in the devices made with cured nanocrystals occurred in the short wavelength (<600 nm) range. Figure 3a shows a comparison of EQE spectra from PVs made with as-deposited CuInSe2 nanocrystals and nanocrystals that had been processed by photonic curing at 2.2 J/cm2. The measurements in Figure 3a are made under a white light bias of 50 mW/cm2. The as-deposited CuInSe2 nanocrystal device has a peak EQE of about 25%, whereas the peak EQE of the cured nanocrystal device is 123%. On the basis of the measured light absorption in the device, the peak internal quantum efficiency (IQE) was found to correspond to 143% (Supporting Information Figure S6). The application of a white light bias has little effect on the as-deposited CuInSe2 nanocrystal devices but had a significant influence on the EQE spectra of the cured nanocrystal devices (see Figure 3b, for example).

Figure 3

Figure 3. EQE enhancements resulting from photonic curing of the CuInSe2 nanocrystal layer used in PV devices. (a) EQE measurements taken under white light bias (50 mW/cm2) for CuInSe2 nanocrystal devices without photonic curing (black curve) compared to the device made with cured (2.2 J/cm2 pulse fluence) nanocrystals (red curve). The short-circuit currents determined from these data, of 4.95 and 14.29 mA/cm2, are consistent with the short-circuit currents measured under AM1.5 illumination (100 mW/cm2). (b) EQE measured under varying white light bias intensity (100, 50, 25, 10, and 0% of a 50 mW/cm2 bias light) with the same intensity of monochromated probe light. There was no change in EQE for the device made with as-deposited nanocrystals (inset), but the EQE decreased significantly for the cured device when the white light bias intensity was reduced to the amounts indicated.

The substantial effect of white light bias on the EQE of cured nanocrystal devices indicates that the curing process introduces traps into the nanocrystal layer that hinder charge extraction under low light conditions. (25, 26) Because EQE measurements of solar cells are performed with a low-intensity monochromatic probe beam, the additional intense white light bias is required to mimic the near full sun conditions experienced by the device in the field, (23) and EQE measurements taken without white light bias can give anomalous results. (23-26) For example, traps in the CdS layer in CdTe/CdS devices usually filled under AM1.5 illumination remain empty under low light conditions, significantly reducing device currents and leading to artificially low EQE values if white light bias is not used. (23-26) CdTe and CIGS PV devices can also exhibit EQE variations with light bias intensity due to photoconductive CdS. (24-27) In our case, the CdS layer is the same for all devices, and the EQE of the as-deposited nanocrystal device is not affected by the white light bias intensity (Figure 3b, inset). However, most telling is that the EQE of the devices with peak EQE > 100% was found to decrease proportionally with the probe light intensity (Supporting Information Figure S7, Table S1), additionally ruling out possible contributions from photoconductive gain or anomalous currents due to trapped carrier extraction related to the bias illumination. The EQE also did not vary with probe beam chopping frequency (Supporting Information Figure S8), eliminating the likelihood of measurement artifacts due to slow carrier kinetics. Lastly, the measured Jsc values of the CuInSe2 nanocrystal devices in Figure 2 agree pretty well with those calculated from the EQE measurements in Figure 3. The measured Jsc from the as-deposited nanocrystal device was 5.65 mA/cm2, compared to 4.95 mA/cm2 calculated from EQE data. The cured nanocrystal device Jsc is 18.65 mA/cm2 (Figure 2h), compared to 14.29 mA/cm2 calculated from the EQE data. The lower calculated Jsc value for the cured nanocrystal device results from the fact that the white light bias intensity in our IPCE setup was limited to ∼50 mW/cm2, and because the EQE of these devices was sensitive to the bias intensity, the measured EQE under white light bias was still slightly lower than that under true AM1.5 illumination at 100 mW/cm2.

To help verify that MEG occurs in the nanocrystal films that exhibit peak EQE > 100%, the recombination dynamics of photoexcited excitons were determined by TA spectroscopy with 400 and 800 nm pump light. Figure 4a,b shows the decay in bleach signal near the absorption edge (see Supporting Information Figure S9 for a spectrum of the bleach signal). (28, 29) Multiexcitons undergo Auger recombination (the inverse process to MEG) on very short time scales (typically ∼100 ps) compared to much longer lived single excitons. (28) With 800 nm pump light (Figure 4a), an individual photon does not have enough energy to induce MEG, and only one exciton per nanocrystal is generated at low pump fluence. Under these conditions, the kinetics curves (normalized at delay times >1 ns) overlap. When the 800 nm pump fluence is increased so that some nanocrystals absorb more than one photon per excitation pulse, multiexcitons form and Auger recombination dynamics arise. The 400 nm pump photons carry about three times the band gap energy; therefore, MEG from a single photon is possible, and Auger recombination dynamics can be observed even at low fluences. Figure 4b shows the bleach signal for two low-fluence TA kinetics with 400 nm pump wavelength as well as an average of the 3, 6, and 15 μJ/cm2 TA curves at 800 nm pump wavelength for comparison. The low-fluence TA kinetics at 400 nm show increased signal at short times compared to the low-fluence 800 nm pump TA kinetics, indicating the presence of Auger recombination and therefore MEG. The possibility of anomalous results due to photocharging was eliminated by rapidly translating the sample through the measurement area. (30) Negligible differences were observed between measurements of static and translating samples (Supporting Information Figure S10).

Figure 4

Figure 4. TA spectroscopy of CuInSe2 nanocrystal films after photonic curing. (a) TA kinetics normalized to −Δα = 1 at 1000 ps with an 800 nm pump wavelength and pump fluences of 300 (dark blue), 90 (green), 60 (pink), 30 (teal), 15 (blue), 6 (red), and 3 μJ/cm2 (black). (b) TA kinetics normalized to −Δα = 1 at 1000 ps with a 400 nm pump wavelength and pump fluences of 18 (red) and 9 μJ/cm2 (blue). The average low fluence background (average of 3, 6, 15, and 30 μJ/cm2 signals) at an 800 nm pump wavelength is also shown for comparison (black). (c) TA kinetics showing the Auger recombination rate. The single exciton TA kinetics background (average 800 nm wavelength low-fluence pump) is subtracted from the high-fluence TA kinetics at an 800 nm, 300 μJ/cm2 pump, which shows the creation of multiexcitons due to the absorption of multiple photons per nanocrystal. The kinetics are plotted on a log scale and can be fitted to a single exponential with a time constant of 92 ps. (d) TA kinetics showing Auger recombination at a 400 nm pump and low fluence. The single-exciton TA kinetics background (average 800 nm wavelength low-fluence pump) is subtracted from the TA kinetics at a 400 nm, 9 μJ/cm2 pump, which should only show Auger recombination if MEG is present. The kinetics are plotted on a log scale and can be fitted to a single exponential with a time constant of 74 ps.

The average single exciton recombination kinetics at an 800 nm pump and low fluence was used as a baseline to determine the Auger recombination rate. In Figure 4c,d, the single-exciton recombination background kinetics were subtracted (time constant of ∼600 ps) from the TA kinetics at the 800 nm pump wavelength and 300 μJ/cm2 fluence (a high-power regime where multiple photons are present per absorbing nanocrystal) and at the 400 nm pump wavelength and 9 μJ/cm2 fluence (in the regime of less than one photon per nanocrystal). The curves in Figure 4c,d both fit single exponentials with similar time constants of 93 and 74 ps, respectively. The presence of Auger recombination at low fluences of 400 nm pump light supports the presence of MEG in the cured CuInSe2 nanocrystal films, and the estimated MEG quantum yield of 125% is close to the device peak IQE measurements of ∼143% (see Supporting Information Figures S6 and S11).

The influence of the trap states limiting multiexciton extraction under low light conditions on the exciton decay dynamics was tested by applying an intense white light bias during TA measurements, and there was little effect on the TA kinetics (see Supporting Information Figure S12). The traps seem to have a detrimental effect only on charge extraction. Perhaps these traps are related to unpassivated surface defects. (31-34) TEM shows that prior to photonic curing, the nanocrystals have a diameter of 8.1 ± 2.1 nm, which is smaller than the Bohr exciton radius for CuInSe2 (Supporting Information Figure S5). (35) The red shift of 60 meV in the peak wavelength of the absorption bleach in the TA spectrum (Supporting Information Figure S9) after curing is consistent with a slight loss of quantum confinement resulting from the loss of capping ligands. However, the fact that the reduction in optical gap is larger than this (0.12 eV, Supporting Information Figure S13) and that the TA spectrum exhibits an asymmetric broadening into the red part of the spectrum (Supporting Information Figure S9) indicate that trap-related defects are present after photonic curing. In order to extract multiexcitons from a device, the photogenerated multiple electron–hole pairs must separate before Auger recombination can occur. CdTe and PbS nanocrystals both show charge-transfer rates between nanocrystals of ∼100 ps, and biexcitons can be extracted from separate nanocrystals prior to Auger recombination. (9, 36-38) Charge transfer rates as fast as 50 fs have been observed in PbSe nanocrystals and reported as hot carrier extraction. (39) Our calculated biexciton decay time is similar to that of coupled PbSe quantum dot films (∼100 ps), which have also demonstrated MEG in devices. (14, 28) Enhanced coupling in films of PbSe nanocrystals has enabled efficient conversion of multiexcitons into free charge carriers compared to the competing Auger recombination process. (40) In films of CuInSe2 nanocrystals coated with oleylamine ligands, charge carrier separation is inefficient, and multiexcitons are lost to Auger recombination (see Figure 1b). The observation of peak QEs over 100% after photonic curing indicates that multiexciton dissociation and extraction (as individual charges or as excitons) becomes much more efficient (see Figure 1c).

Ink-deposited CuInSe2 nanocrystal PVs treated by photonic curing exhibited high short-circuit currents and peak EQEs of over 120%. TA measurements provide substantiation that the high EQE results from the extraction of multiexcitons. It appears that photonic curing brings the nanocrystals into better electrical contact and enables multiexciton extraction. Ligand removal, however, also seems to induce a significant amount of traps in the nanocrystal film, which reduces device performance, especially under low light conditions. Passivation of these surface traps could perhaps provide a route to high-efficiency devices that utilize MEG and extraction along with reasonably efficient charge extraction for electrons and holes photoexcited closer to the band gap energy.

Supporting Information

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Experimental details, including materials used, nanocrystal synthesis, film deposition methods, PV device fabrication, characterization, and PV device testing, additional data ans supplementary figures, including the confirmation of ligand loss during photonic curing of nanocrystal films by TGA and FTIR, the calculated substrate temperature during photonic curing process, the extent of nanocrystal sintering after photonic curing determined by XRD, the IQE and MEG quantum yields, the effect of light biasing on EQE measurements, and TA spectroscopy, and Table S1, showing the EQE and calculated Jsc for each probe beam intensity. This material is available free of charge via the Internet at http://pubs.acs.org.

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Author Information

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  • Corresponding Author
    • Brian A. Korgel - McKetta Department of Chemical Engineering, Texas Materials Institute, Center for Nano- and Molecular Science and Technology, The University of Texas at Austin, Austin, Texas 78712, United States Email: [email protected]
  • Authors
    • C. Jackson Stolle - McKetta Department of Chemical Engineering, Texas Materials Institute, Center for Nano- and Molecular Science and Technology, The University of Texas at Austin, Austin, Texas 78712, United States
    • Taylor B. Harvey - McKetta Department of Chemical Engineering, Texas Materials Institute, Center for Nano- and Molecular Science and Technology, The University of Texas at Austin, Austin, Texas 78712, United States
    • Douglas R. Pernik - McKetta Department of Chemical Engineering, Texas Materials Institute, Center for Nano- and Molecular Science and Technology, The University of Texas at Austin, Austin, Texas 78712, United States
    • Jarett I. Hibbert - McKetta Department of Chemical Engineering, Texas Materials Institute, Center for Nano- and Molecular Science and Technology, The University of Texas at Austin, Austin, Texas 78712, United States
    • Jiang Du - McKetta Department of Chemical Engineering, Texas Materials Institute, Center for Nano- and Molecular Science and Technology, The University of Texas at Austin, Austin, Texas 78712, United States
    • Dong Joon Rhee - McKetta Department of Chemical Engineering, Texas Materials Institute, Center for Nano- and Molecular Science and Technology, The University of Texas at Austin, Austin, Texas 78712, United States
    • Vahid A. Akhavan - NovaCentrix, 200-B Parker Drive, Suite 580, Austin, Texas 78728, United States
    • Richard D. Schaller - Center for Nanoscale Materials, Argonne National Laboratories, Argonne, Illinios 60439, United StatesDepartment of Chemistry, Northwestern University, Evanston, Illinois 60208, United States
  • Notes
    The authors declare no competing financial interest.

Acknowledgment

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Financial support of this work was provided by the Robert A. Welch Foundation (F-1464) and the National Science Foundation Industry/University Cooperative Research Center on Next Generation Photovoltaics (IIP-1134849). Financial support was also provided for C.J.S. and D.R.P. by the National Science Foundation Graduate Research Fellowship program under Grant No. DGE-1110007. Use of the Center for Nanoscale Materials was supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. The authors also thank Sayan Saha and Sanjay Banerjee for use of their QEX10 Solar Cell Spectral Response Measurement System.

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  • Abstract

    Figure 1

    Figure 1. Photonic curing of nanocrystal films on Au-coated glass substrates. (a) Photonic curing can be used to remove oleylamine capping ligands from the CuInSe2 nanocrystal film without inducing nanocrystal grain growth. (b) When the capping ligands are present, they inhibit the collection of multiexcitons from the film, leading to electron–hole recombination by Auger recombination. (c) Without the ligand barrier between nanocrystals, multiexciton transport becomes much more probable.

    Figure 2

    Figure 2. CuInSe2 nanocrystal layers before and after photonic curing and their PV device performance. Top-down and cross-sectional SEM images of an oleylamine-capped CuInSe2 (CIS) nanocrystal film on Au-coated glass (a, d) before and after photonic curing with (b, e) 2.2 and (c, f) and 3 J/cm2 pulse fluence. (g–i) Corresponding current–voltage measurements (the black curve is dark current; the red curve is measured under AM1.5G illumination (100 mW/cm2)) of devices made with the nanocrystal films provided below the SEM images.

    Figure 3

    Figure 3. EQE enhancements resulting from photonic curing of the CuInSe2 nanocrystal layer used in PV devices. (a) EQE measurements taken under white light bias (50 mW/cm2) for CuInSe2 nanocrystal devices without photonic curing (black curve) compared to the device made with cured (2.2 J/cm2 pulse fluence) nanocrystals (red curve). The short-circuit currents determined from these data, of 4.95 and 14.29 mA/cm2, are consistent with the short-circuit currents measured under AM1.5 illumination (100 mW/cm2). (b) EQE measured under varying white light bias intensity (100, 50, 25, 10, and 0% of a 50 mW/cm2 bias light) with the same intensity of monochromated probe light. There was no change in EQE for the device made with as-deposited nanocrystals (inset), but the EQE decreased significantly for the cured device when the white light bias intensity was reduced to the amounts indicated.

    Figure 4

    Figure 4. TA spectroscopy of CuInSe2 nanocrystal films after photonic curing. (a) TA kinetics normalized to −Δα = 1 at 1000 ps with an 800 nm pump wavelength and pump fluences of 300 (dark blue), 90 (green), 60 (pink), 30 (teal), 15 (blue), 6 (red), and 3 μJ/cm2 (black). (b) TA kinetics normalized to −Δα = 1 at 1000 ps with a 400 nm pump wavelength and pump fluences of 18 (red) and 9 μJ/cm2 (blue). The average low fluence background (average of 3, 6, 15, and 30 μJ/cm2 signals) at an 800 nm pump wavelength is also shown for comparison (black). (c) TA kinetics showing the Auger recombination rate. The single exciton TA kinetics background (average 800 nm wavelength low-fluence pump) is subtracted from the high-fluence TA kinetics at an 800 nm, 300 μJ/cm2 pump, which shows the creation of multiexcitons due to the absorption of multiple photons per nanocrystal. The kinetics are plotted on a log scale and can be fitted to a single exponential with a time constant of 92 ps. (d) TA kinetics showing Auger recombination at a 400 nm pump and low fluence. The single-exciton TA kinetics background (average 800 nm wavelength low-fluence pump) is subtracted from the TA kinetics at a 400 nm, 9 μJ/cm2 pump, which should only show Auger recombination if MEG is present. The kinetics are plotted on a log scale and can be fitted to a single exponential with a time constant of 74 ps.

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  • Supporting Information

    Supporting Information


    Experimental details, including materials used, nanocrystal synthesis, film deposition methods, PV device fabrication, characterization, and PV device testing, additional data ans supplementary figures, including the confirmation of ligand loss during photonic curing of nanocrystal films by TGA and FTIR, the calculated substrate temperature during photonic curing process, the extent of nanocrystal sintering after photonic curing determined by XRD, the IQE and MEG quantum yields, the effect of light biasing on EQE measurements, and TA spectroscopy, and Table S1, showing the EQE and calculated Jsc for each probe beam intensity. This material is available free of charge via the Internet at http://pubs.acs.org.


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    Most electronic Supporting Information files are available without a subscription to ACS Web Editions. Such files may be downloaded by article for research use (if there is a public use license linked to the relevant article, that license may permit other uses). Permission may be obtained from ACS for other uses through requests via the RightsLink permission system: http://pubs.acs.org/page/copyright/permissions.html.