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Effects of Layer Thickness and Annealing of PEDOT:PSS Layers in Organic Photodetectors

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Cavendish Laboratory, Department of Physics, University of Cambridge, J. J. Thomson Avenue, Cambridge CB3 0HE, United Kingdom
*Corresponding author. E-mail: [email protected]
Cite this: Macromolecules 2009, 42, 17, 6741–6747
Publication Date (Web):July 29, 2009
https://doi.org/10.1021/ma901182u
Copyright © 2009 American Chemical Society

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    Abstract

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    We have investigated the effects of thickness variation and thermal treatment of the electrode polymer poly(3,4-ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDOT:PSS) in photovoltaic and photodetector devices using conjugated polymer blends as the photoactive material. By variation of the PEDOT:PSS layer thickness between 25 and 150 nm, we found optimum device performance, in particular low dark current and high external quantum efficiency (EQE) and open-circuit voltage (Voc), at around 70 nm. This has been observed for two different active layers. Annealing studies on the PEDOT:PSS films, with temperatures varied between 120 and 400 °C, showed an optimum device performance, in particular EQE and Voc at 250 °C. This optimum performance was found to be associated with loss of water from the PSS shell of the PEDOT:PSS grains. For annealing temperatures above 260 °C, device performance was dramatically reduced. This was associated with chemical decomposition leading to loss of sulfonic acid, although this did not significantly affect the in-plane conductivity.

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