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Ferroelectric Enhanced Performance of a GeSn/Ge Dual-Nanowire Photodetector

  • Yuekun Yang
    Yuekun Yang
    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
    Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
    More by Yuekun Yang
  • Xudong Wang
    Xudong Wang
    State Key Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
    More by Xudong Wang
  • Chen Wang
    Chen Wang
    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
    More by Chen Wang
  • Yuxin Song
    Yuxin Song
    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
    More by Yuxin Song
  • Miao Zhang
    Miao Zhang
    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
    More by Miao Zhang
  • Zhongying Xue
    Zhongying Xue
    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
  • Shumin Wang
    Shumin Wang
    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
    More by Shumin Wang
  • Zhongyunshen Zhu
    Zhongyunshen Zhu
    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
  • Guanyu Liu
    Guanyu Liu
    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
    More by Guanyu Liu
  • Panlin Li
    Panlin Li
    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
    More by Panlin Li
  • Linxi Dong
    Linxi Dong
    Key Laboratory of RF Circuits and System of Ministry of Education, College of Electronic and Information, Hangzhou Dianzi University, Hangzhou 310018, China
    More by Linxi Dong
  • Yongfeng Mei
    Yongfeng Mei
    Department of Materials Science, State Key Laboratory of ASIC and Systems, Fudan University, Shanghai 200433, China
    More by Yongfeng Mei
  • Paul K. Chu
    Paul K. Chu
    Department of Physics, Department of Materials Science & Engineering, and Department of Biomedical Engineering, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong, China
    More by Paul K. Chu
  • Weida Hu
    Weida Hu
    State Key Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
    More by Weida Hu
  • Jianlu Wang*
    Jianlu Wang
    State Key Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
    *Email: [email protected]
    More by Jianlu Wang
  • , and 
  • Zengfeng Di*
    Zengfeng Di
    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
    *Email: [email protected]
    More by Zengfeng Di
Cite this: Nano Lett. 2020, 20, 5, 3872–3879
Publication Date (Web):April 15, 2020
https://doi.org/10.1021/acs.nanolett.0c01039
Copyright © 2020 American Chemical Society
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Supporting Info (1)»

Abstract

Abstract Image

GeSn offers a reduced bandgap than Ge and has been utilized in Si-based infrared photodetectors with an extended cutoff wavelength. However, the traditional GeSn/Ge heterostructure usually consists of defects like misfit dislocations due to the lattice mismatch issue. The defects with the large feature size of a photodetector fabricated on bulk GeSn/Ge heterostructures induce a considerable dark current. Here, we demonstrate a flexible GeSn/Ge dual-nanowire (NW) structure, in which the strain relaxation is achieved by the elastic deformation without introducing defects, and the feature dimension is naturally at the nanoscale. A photodetector with a low dark current can be built on a GeSn/Ge dual-NW, which exhibits an extended detection wavelength beyond 2 μm and enhanced responsivity compared to the Ge NW. Moreover, the dark current can be further suppressed by the depletion effect from the ferroelectric polymer side gate. Our work suggests the flexible GeSn/Ge dual-NW may open an avenue for Si-compatible optoelectronic circuits operating in the short-wavelength infrared range.

Supporting Information

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The Supporting Information is available free of charge at https://pubs.acs.org/doi/10.1021/acs.nanolett.0c01039.

  • Review of photodetector devices built on different materials and structures; nanowire synthesis; experimental procedure; characterization of Ge NW and GeSn/Ge dual-NW; SEM images of various substrates after Ge NW growth; Sn composition in GeSn/Ge dual-NW; surface morphologies and Raman spectra of Ge NW and GeSn/Ge dual-NW (PDF)

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