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Atomic Force Microscopy (AFM)-Based Nanografting for the Study of Self-Assembled Monolayer Formation of Organophosphonic Acids on Al2O3 Single-Crystal Surfaces
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    Atomic Force Microscopy (AFM)-Based Nanografting for the Study of Self-Assembled Monolayer Formation of Organophosphonic Acids on Al2O3 Single-Crystal Surfaces
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    Technical and Macromolecular Chemistry, University of Paderborn, Warburger Straße 100, 33098 Paderborn, Germany
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    Langmuir

    Cite this: Langmuir 2012, 28, 17, 6919–6927
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    https://doi.org/10.1021/la300687y
    Published April 5, 2012
    Copyright © 2012 American Chemical Society

    Abstract

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    Adsorption, stability, and organization kinetics of organophosphonic acids on single-crystalline alumina surfaces were investigated by means of atomic force microscopy (AFM)-based imaging, nanoshaving, and nanografting. AFM friction and phase imaging have shown that chemical etching and subsequent annealing led to heterogeneities on single-crystalline surfaces with (0001) orientation. Self-assembly and stability of octadecylphosphonic acid (ODPA) were shown to be strictly dependent upon the observed heterogeneities of the surface termination, where it was locally shown that ODPA can loosely or strongly bind on different terminations of the crystal surface. Organization kinetics of ODPA was monitored with nanografting on (0001) surfaces. Supported by measurements of surface wettability and diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS), it was demonstrated that the lack of organization within the protective adsorbed hexylphosphonic acid (HPA) monolayer on alumina surfaces facilitated the reduced confinement effect during nanografting, such that kinetics information on the organization process of ODPA could be obtained.

    Copyright © 2012 American Chemical Society

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    Supporting Information

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    Static contact angle measurements of bare, HPA- and ODPA-covered Al2O3 single crystals (Figure S1), DRIFTS measurements of HPA- and ODPA-covered Al2O3 single crystals (Figure S2), and UHV–AFM measurements of bare Al2O3 crystal at elevated temperature (Figure S3). This material is available free of charge via the Internet at http://pubs.acs.org.

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    Cited By

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    This article is cited by 14 publications.

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    Langmuir

    Cite this: Langmuir 2012, 28, 17, 6919–6927
    Click to copy citationCitation copied!
    https://doi.org/10.1021/la300687y
    Published April 5, 2012
    Copyright © 2012 American Chemical Society

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