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Strong Plasmon Reflection at Nanometer-Size Gaps in Monolayer Graphene on SiC

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† CIC nanoGUNE Consolider, 20018 Donostia-San Sebastián, Spain
§ Instituto de Ciencia de Materiales de Aragón and Departamento de Física de la Materia Condensada, CSIC-Universidad de Zaragoza, E-50009, Zaragoza, Spain
‡ IKERBASQUE Basque Foundation for Science, 48011 Bilbao, Spain
∥ ICREA-Institució Catalana de Recerca i Estudis Avançats, Barcelona, Spain
# Department of Physics, Kasetsart University, Bangkok 10900, Thailand
⊥ Department Physik, Universität Erlangen-Nürnberg, 91058 Erlangen, Germany
□ Institut für Physik - Technische Physik, Technische Universität Chemnitz, 09126 Chemnitz, Germany
■ Département de Physique de la Matière Condensée, Université de Geneve, 1211 Genève, Switzerland
ICFO-Institut de Ciéncies Fotoniques, Mediterranean Technology Park, 08860 Castelldefels, Barcelona, Spain
*E-mail: [email protected]
Cite this: Nano Lett. 2013, 13, 12, 6210–6215
Publication Date (Web):November 4, 2013
https://doi.org/10.1021/nl403622t
Copyright © 2013 American Chemical Society
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Abstract

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We employ tip-enhanced infrared near-field microscopy to study the plasmonic properties of epitaxial quasi-free-standing monolayer graphene on silicon carbide. The near-field images reveal propagating graphene plasmons, as well as a strong plasmon reflection at gaps in the graphene layer, which appear at the steps between the SiC terraces. When the step height is around 1.5 nm, which is two orders of magnitude smaller than the plasmon wavelength, the reflection signal reaches 20% of its value at graphene edges, and it approaches 50% for step heights as small as 5 nm. This intriguing observation is corroborated by numerical simulations and explained by the accumulation of a line charge at the graphene termination. The associated electromagnetic fields at the graphene termination decay within a few nanometers, thus preventing efficient plasmon transmission across nanoscale gaps. Our work suggests that plasmon propagation in graphene-based circuits can be tailored using extremely compact nanostructures, such as ultranarrow gaps. It also demonstrates that tip-enhanced near-field microscopy is a powerful contactless tool to examine nanoscale defects in graphene.

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