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ACS Publications. Most Trusted. Most Cited. Most Read
Flexible Ferroelectric Hafnia-Based Synaptic Transistor by Focused-Microwave Annealing
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    Functional Inorganic Materials and Devices

    Flexible Ferroelectric Hafnia-Based Synaptic Transistor by Focused-Microwave Annealing
    Click to copy article linkArticle link copied!

    • Hongrae Joh
      Hongrae Joh
      School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, South Korea
      More by Hongrae Joh
    • Minhyun Jung
      Minhyun Jung
      School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, South Korea
      More by Minhyun Jung
    • Junghyeon Hwang
      Junghyeon Hwang
      School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, South Korea
    • Youngin Goh
      Youngin Goh
      School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, South Korea
      More by Youngin Goh
    • Taeseung Jung
      Taeseung Jung
      School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, South Korea
    • Sanghun Jeon*
      Sanghun Jeon
      School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, South Korea
      *Email: [email protected]
      More by Sanghun Jeon
    Other Access OptionsSupporting Information (1)

    ACS Applied Materials & Interfaces

    Cite this: ACS Appl. Mater. Interfaces 2022, 14, 1, 1326–1333
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    https://doi.org/10.1021/acsami.1c16873
    Published December 20, 2021
    Copyright © 2021 American Chemical Society

    Abstract

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    Hafnia-based ferroelectric memory devices with excellent ferroelectricity, low power consumption, and fast operation speed have attracted considerable interest with the ever-growing desire for nonvolatile memory in flexible electronics. However, hafnia films are required to perform a high temperature (>500 °C) annealing process for crystallization into the ferroelectric orthorhombic phase. It can hinder the integration of hafnia ferroelectric films on flexible substrates including plastic and polymer, which are not endurable at high temperatures above 300 °C. Here, we propose the extremely low-temperature (∼250 °C) process for crystallization of Hf0.5Zr0.5O2 (HZO) thin films by applying a focused-microwave induced annealing method. HZO thin films on a flexible mica substrate exhibits robust remnant polarization (2Pr ∼ 50 μC/cm2), which is negligibly changed under bending tests. In addition, the electrical characteristics of a HZO capacitor on the mica substrate were evaluated, and ferroelectric thin film transistors (Fe-TFTs), using a HZO gate insulator, were fabricated on mica substrates for flexible synapse applications. Symmetric potentiation and depression characteristics are successfully demonstrated in the Fe-TFT memory devices, and the synaptic devices result in high recognition accuracy of 91.44%. The low-temperature annealing method used in this work are promising for forming hafnia-based Fe-TFT memory devices as a building block on a flexible platform.

    Copyright © 2021 American Chemical Society

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    Supporting Information

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    The Supporting Information is available free of charge at https://pubs.acs.org/doi/10.1021/acsami.1c16873.

    • IV curves of HZO films; switching speed measurements of HZO films; XRD spectrums and peak fitting information of HZO films; PFM images of HZO films; transfer curves of IZTO channel-based TFT; transfer curves and memory windows extraction of Fe-TFTs; retention properties of Fe-TFTs; and pulse schematics of potentiation and depression characteristics measurements (PDF)

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    Cited By

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    This article is cited by 16 publications.

    1. Xingpeng Liu, Chunshu Wei, Fabi Zhang, Ying Peng, Tangyou Sun, Yiming Peng, Huiping Tang, Junfeng Yang, Mingjian Ding, Chunsheng Jiang, Haiou Li. A Flexible Hf0.5Zr0.5O2 Nonvolatile Memory with High Polarization Based on Mica Substrate. ACS Applied Electronic Materials 2024, 6 (8) , 6266-6274. https://doi.org/10.1021/acsaelm.4c01108
    2. Junghyeon Hwang, Hongrae Joh, Chaeheon Kim, Jinho Ahn, Sanghun Jeon. Monolithically Integrated Complementary Ferroelectric FET XNOR Synapse for the Binary Neural Network. ACS Applied Materials & Interfaces 2024, 16 (2) , 2467-2476. https://doi.org/10.1021/acsami.3c13945
    3. Hongrae Joh, Sooji Nam, Minhyun Jung, Hunbeom Shin, Sung Haeng Cho, Sanghun Jeon. Ferroelectric Hafnia-Based M3D FeTFTs Annealed at Extremely Low Temperatures and TCAM Cells for Computing-in-Memory Applications. ACS Applied Materials & Interfaces 2023, 15 (44) , 51339-51349. https://doi.org/10.1021/acsami.3c10597
    4. Venkateswarlu Gaddam, Giuk Kim, Taeho Kim, Minhyun Jung, Chaeheon Kim, Sanghun Jeon. Novel Approach to High κ (∼59) and Low EOT (∼3.8 Å) near the Morphotrophic Phase Boundary with AFE/FE (ZrO2/HZO) Bilayer Heterostructures and High-Pressure Annealing. ACS Applied Materials & Interfaces 2022, 14 (38) , 43463-43473. https://doi.org/10.1021/acsami.2c08691
    5. D.-G. Jin, S.-G. Kim, H. Jeon, E.-J. Park, S.-H. Kim, J.-Y. Kim, H.-Y. Yu. Improvement of polarization switching in ferroelectric transistor by interface trap reduction for brain-inspired artificial synapses. Materials Today Nano 2023, 22 , 100320. https://doi.org/10.1016/j.mtnano.2023.100320
    6. Chalisa Gier, Marwa Ben Yaala, Callum Wiseman, Sean MacFoy, Martin Chicoine, François Schiettekatte, James Hough, Sheila Rowan, Iain Martin, Peter MacKay, Stuart Reid. Controlling the optical properties of hafnium dioxide thin films deposited with electron cyclotron resonance ion beam deposition. Thin Solid Films 2023, 771 , 139781. https://doi.org/10.1016/j.tsf.2023.139781
    7. Atif Jan, Thomas Rembert, Sunil Taper, Joanna Symonowicz, Nives Strkalj, Taehwan Moon, Yun Seong Lee, Hagyoul Bae, Hyun Jae Lee, Duk‐Hyun Choe, Jinseong Heo, Judith MacManus‐Driscoll, Bartomeu Monserrat, Giuliana Di Martino. In Operando Optical Tracking of Oxygen Vacancy Migration and Phase Change in few Nanometers Ferroelectric HZO Memories. Advanced Functional Materials 2023, 71 , 2214970. https://doi.org/10.1002/adfm.202214970
    8. Dandan Hao, Zhenyu Yang, Jia Huang, Fukai Shan. Recent Developments of Optoelectronic Synaptic Devices Based on Metal Halide Perovskites. Advanced Functional Materials 2023, 33 (8) , 2211467. https://doi.org/10.1002/adfm.202211467
    9. Shaoan Yan, Junyi Zang, Pei Xu, Yingfang Zhu, Gang Li, Qilai Chen, Zhuojun Chen, Yan Zhang, Minghua Tang, Xuejun Zheng. Recent progress in ferroelectric synapses and their applications. Science China Materials 2022, 10 https://doi.org/10.1007/s40843-022-2318-9
    10. YiLong Wang, Minghui Cao, Jing Bian, Qiang Li, Jie Su. Flexible ZnO Nanosheet‐Based Artificial Synapses Prepared by Low‐Temperature Process for High Recognition Accuracy Neuromorphic Computing. Advanced Functional Materials 2022, 32 (52) , 2209907. https://doi.org/10.1002/adfm.202209907
    11. Minhyun Jung, Venkateswarlu Gaddam, Sanghun Jeon. A review on morphotropic phase boundary in fluorite-structure hafnia towards DRAM technology. Nano Convergence 2022, 9 (1) https://doi.org/10.1186/s40580-022-00333-7
    12. Sheng-Tao Mo, Kai-Ming Feng, Jing-Lin Pang, Kuo Ouyang, Li-Mei Jiang, Qiong Yang, Biao Zhang, Jie Jiang. All-inorganic transparent Hf0.85Ce0.15O2 ferroelectric thin films with high flexibility and stability. Nano Research 2022, 8 https://doi.org/10.1007/s12274-022-5074-z
    13. I. Margolin, A. Chouprik, V. Mikheev, S. Zarubin, D. Negrov. Flexible HfO2-based ferroelectric memristor. Applied Physics Letters 2022, 121 (10) , 102901. https://doi.org/10.1063/5.0102290
    14. Biyao Zhao, Yunting Yan, Jinshun Bi, Gaobo Xu, Yannan Xu, Xueqin Yang, Linjie Fan, Mengxin Liu. Improved Ferroelectric Properties in Hf0.5Zr0.5O2 Thin Films by Microwave Annealing. Nanomaterials 2022, 12 (17) , 3001. https://doi.org/10.3390/nano12173001
    15. Junghyeon Hwang, Sehee Lim, Giuk Kim, Seong-Ook Jung, Sanghun Jeon. Non-Volatile Majority Function Logic Using Ferroelectric Memory for Logic in Memory Technology. IEEE Electron Device Letters 2022, 43 (7) , 1049-1052. https://doi.org/10.1109/LED.2022.3179385
    16. Wei Sheng Wang, Zheng Yu Ren, Zhi Wen Shi, Hui Xiao, Yu Heng Zeng, Li Qiang Zhu. Flexible Nanocellulose Gated Pseudo-Diode for Neuromorphic Electronic Applications. IEEE Electron Device Letters 2022, 43 (5) , 737-740. https://doi.org/10.1109/LED.2022.3160494

    ACS Applied Materials & Interfaces

    Cite this: ACS Appl. Mater. Interfaces 2022, 14, 1, 1326–1333
    Click to copy citationCitation copied!
    https://doi.org/10.1021/acsami.1c16873
    Published December 20, 2021
    Copyright © 2021 American Chemical Society

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