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Low-Dose 4D-STEM Tomography for Beam-Sensitive Nanocomposites
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    Low-Dose 4D-STEM Tomography for Beam-Sensitive Nanocomposites
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    • Milena Hugenschmidt
      Milena Hugenschmidt
      EMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium
    • Daen Jannis
      Daen Jannis
      EMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium
      More by Daen Jannis
    • Ajinkya Anil Kadu
      Ajinkya Anil Kadu
      EMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium
      Centrum Wiskunde & Informatica, Science Park 123, 1098 XG Amsterdam, The Netherlands
    • Lukas Grünewald
      Lukas Grünewald
      EMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium
    • Sarah De Marchi
      Sarah De Marchi
      CINBIO, Universidade de Vigo, Departamento de Química Física, Campus Universitario As Lagoas, Marcosende, 36310 Vigo, Spain
      Galicia Sur Health Research Institute (IIS Galicia Sur), SERGAS-UVIGO, 36310 Vigo, Spain
    • Jorge Pérez-Juste
      Jorge Pérez-Juste
      CINBIO, Universidade de Vigo, Departamento de Química Física, Campus Universitario As Lagoas, Marcosende, 36310 Vigo, Spain
      Galicia Sur Health Research Institute (IIS Galicia Sur), SERGAS-UVIGO, 36310 Vigo, Spain
    • Johan Verbeeck
      Johan Verbeeck
      EMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium
    • Sandra Van Aert*
      Sandra Van Aert
      EMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium
      *[email protected]
    • Sara Bals*
      Sara Bals
      EMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium
      *[email protected]
      More by Sara Bals
    Other Access OptionsSupporting Information (4)

    ACS Materials Letters

    Cite this: ACS Materials Lett. 2024, 6, 1, 165–173
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    https://doi.org/10.1021/acsmaterialslett.3c01042
    Published December 11, 2023
    Copyright © 2023 American Chemical Society

    Abstract

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    Electron tomography is essential for investigating the three-dimensional (3D) structure of nanomaterials. However, many of these materials, such as metal–organic frameworks (MOFs), are extremely sensitive to electron radiation, making it difficult to acquire a series of projection images for electron tomography without inducing electron-beam damage. Another significant challenge is the high contrast in high-angle annular dark field scanning transmission electron microscopy that can be expected for nanocomposites composed of a metal nanoparticle and an MOF. This strong contrast leads to so-called metal artifacts in the 3D reconstruction. To overcome these limitations, we here present low-dose electron tomography based on four-dimensional scanning transmission electron microscopy (4D-STEM) data sets, collected using an ultrafast and highly sensitive direct electron detector. As a proof of concept, we demonstrate the applicability of the method for an Au nanostar embedded in a ZIF-8 MOF, which is of great interest for applications in various fields, including drug delivery.

    Copyright © 2023 American Chemical Society

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    Supporting Information

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    The Supporting Information is available free of charge at https://pubs.acs.org/doi/10.1021/acsmaterialslett.3c01042.

    • 3D reconstruction (MPG)

    • Original and denoised tilt series of the MOF (MP4)

    • Original and denoised tilt series of the NP (MP4)

    • Azimuthally integrated scattered intensities, description of the projection requirement, discussion of the denoising algorithm and the reconstruction quality, orthoslices of the reconstructed MOF and NP, exemplary denoised vSTEM images and forward projections, evaluation of shrinkage, low-resolution TEM images of the NP@ZIF-8 composite as well as UV–vis spectra of the NP and the composite, and tilt series of the MOF and the NP (original and denoised) (PDF)

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    Cited By

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    This article is cited by 1 publications.

    1. Sara Bals, Luis M. Liz-Marzán, Wolfgang J. Parak, Katherine A. Willets, Huolin L. Xin. Best Practices for Using Microscopy Data in Manuscripts: From Pretty Pictures to Scientific Evidence. ACS Nano 2024, 18 (21) , 13453-13457. https://doi.org/10.1021/acsnano.4c05299

    ACS Materials Letters

    Cite this: ACS Materials Lett. 2024, 6, 1, 165–173
    Click to copy citationCitation copied!
    https://doi.org/10.1021/acsmaterialslett.3c01042
    Published December 11, 2023
    Copyright © 2023 American Chemical Society

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