Low-Dose 4D-STEM Tomography for Beam-Sensitive NanocompositesClick to copy article linkArticle link copied!
- Milena HugenschmidtMilena HugenschmidtEMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumMore by Milena Hugenschmidt
- Daen JannisDaen JannisEMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumMore by Daen Jannis
- Ajinkya Anil KaduAjinkya Anil KaduEMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumCentrum Wiskunde & Informatica, Science Park 123, 1098 XG Amsterdam, The NetherlandsMore by Ajinkya Anil Kadu
- Lukas GrünewaldLukas GrünewaldEMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumMore by Lukas Grünewald
- Sarah De MarchiSarah De MarchiCINBIO, Universidade de Vigo, Departamento de Química Física, Campus Universitario As Lagoas, Marcosende, 36310 Vigo, SpainGalicia Sur Health Research Institute (IIS Galicia Sur), SERGAS-UVIGO, 36310 Vigo, SpainMore by Sarah De Marchi
- Jorge Pérez-JusteJorge Pérez-JusteCINBIO, Universidade de Vigo, Departamento de Química Física, Campus Universitario As Lagoas, Marcosende, 36310 Vigo, SpainGalicia Sur Health Research Institute (IIS Galicia Sur), SERGAS-UVIGO, 36310 Vigo, SpainMore by Jorge Pérez-Juste
- Johan VerbeeckJohan VerbeeckEMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumMore by Johan Verbeeck
- Sandra Van Aert*Sandra Van Aert*[email protected]EMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumMore by Sandra Van Aert
- Sara Bals*Sara Bals*[email protected]EMAT and NanoLab, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, BelgiumMore by Sara Bals
Abstract
Electron tomography is essential for investigating the three-dimensional (3D) structure of nanomaterials. However, many of these materials, such as metal–organic frameworks (MOFs), are extremely sensitive to electron radiation, making it difficult to acquire a series of projection images for electron tomography without inducing electron-beam damage. Another significant challenge is the high contrast in high-angle annular dark field scanning transmission electron microscopy that can be expected for nanocomposites composed of a metal nanoparticle and an MOF. This strong contrast leads to so-called metal artifacts in the 3D reconstruction. To overcome these limitations, we here present low-dose electron tomography based on four-dimensional scanning transmission electron microscopy (4D-STEM) data sets, collected using an ultrafast and highly sensitive direct electron detector. As a proof of concept, we demonstrate the applicability of the method for an Au nanostar embedded in a ZIF-8 MOF, which is of great interest for applications in various fields, including drug delivery.
Cited By
This article is cited by 1 publications.
- Sara Bals, Luis M. Liz-Marzán, Wolfgang J. Parak, Katherine A. Willets, Huolin L. Xin. Best Practices for Using Microscopy Data in Manuscripts: From Pretty Pictures to Scientific Evidence. ACS Nano 2024, 18
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, 13453-13457. https://doi.org/10.1021/acsnano.4c05299
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